Built-in self-diagnosis and test time reduction techniques for NAND flash memories

This paper presents a low-cost built-in self-diagnosis (BISD) scheme for NAND flash memories, which can support the March-like test algorithms with page-oriented data backgrounds. Two simple test time reduction techniques are also proposed to reduce the test time. Experimental results show that the proposed BISD circuit for a 2M-bit flash memory only needs 1.7K gates. Also, the proposed test time reduction techniques can effectively reduce the test time. Analysis results show that they can reduce the test time to 48.628% of the normal test scheme for a 4G-bit flash memory tested by the March-FT test algorithm with solid data backgrounds.

[1]  Kewal K. Saluja,et al.  Fault Models and Test Procedures for Flash Memory Disturbances , 2001, J. Electron. Test..

[2]  Kewal K. Saluja,et al.  Optimizing program disturb fault tests using defect-based testing , 2005, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

[3]  Jin-Fu Li,et al.  A built-in self-test and self-diagnosis scheme for embedded SRAM , 2000, Proceedings of the Ninth Asian Test Symposium.

[4]  Jen-Chieh Yeh,et al.  Flash memory built-in self-test using March-like algorithms , 2002, Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002.

[5]  Kewal K. Saluja,et al.  Simulating program disturb faults in flash memories using SPICE compatible electrical model , 2003 .

[6]  Jen-Chieh Yeh,et al.  Flash Memory Testing and Built-In Self-Diagnosis With March-Like Test Algorithms , 2007, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

[7]  Jen-Chieh Yeh,et al.  Diagonal test and diagnostic schemes for flash memories , 2002, Proceedings. International Test Conference.

[8]  Kewal K. Saluja,et al.  Flash memory disturbances: modeling and test , 2001, Proceedings 19th IEEE VLSI Test Symposium. VTS 2001.

[9]  Jin-Fu Li,et al.  A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAM , 2002, J. Electron. Test..