Diagnosis of clustered faults for identical degree topologies

Huang et al, [1998] studied the diagnosis of clustered faults and wafer testing. They proposed a diagnosis algorithm for a probabilistic fault model in simple rectangular grid structures. In this paper, we extend their results and study the diagnosis algorithm for arbitrary identical degree topologies. Our results are useful and valid for a large class of topologies. We investigate the local and global performance of the algorithm under several important fault distributions: Bernoulli failure distribution, Gamma failure distribution, and exponential failure distribution. We demonstrate that the diagnosis scheme can identify almost all nodes successfully even if the percentage of fault-free units is low (much lower than 50%) while almost all units are guaranteed to be correctly identified. In addition, we show that the performance of the algorithm is insensitive to the changes of the percentage.

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