Characterization methods for submicron MOSFETs

Preface. 1. Static Measurements and Parameter Extraction. 2. Small Signal Characterization of VLSI MOSFETs. 3. Charge Pumping. 4. Deep Level Transient Spectroscopy. 5. Individual Interface Traps and Telegraph Noise. 6. Characterization of SOI MOSFETs. 7. Modern Analog IC Characterization Techniques. Index.