Phase-map measurements by interferometry with sinusoidal phase modulation and four integrating buckets.
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[1] P. J. Caber. Interferometric profiler for rough surfaces. , 1993, Applied optics.
[2] B. Bhushan,et al. Measurement of surface topography of magnetic tapes by Mirau interferometry. , 1985, Applied optics.
[3] K Creath,et al. Extended averaging technique for derivation of error-compensating algorithms in phase-shifting interferometry. , 1995, Applied optics.
[4] V Loriette,et al. Birefringence imaging with imperfect benches: application to large-scale birefringence measurements. , 2000, Applied optics.
[5] Kenneth D. Stumpf. Real-Time Interferometer , 1979 .
[6] A C Boccara,et al. Phase measurements with wide-aperture interferometers. , 2000, Applied optics.
[7] J. Greivenkamp,et al. Phase Shifting Interferometers , 1992 .
[8] O. Sasaki,et al. Sinusoidal phase modulating interferometry for surface profile measurement. , 1986, Applied optics.
[9] Dennis C. Ghiglia,et al. Two-Dimensional Phase Unwrapping: Theory, Algorithms, and Software , 1998 .
[10] Mark P. Davidson,et al. An Application Of Interference Microscopy To Integrated Circuit Inspection And Metrology , 1987, Advanced Lithography.
[11] O. Sasaki,et al. Analysis of measurement accuracy in sinusoidal phase modulating interferometry. , 1986, Applied optics.
[12] G S Kino,et al. Mirau correlation microscope. , 1990, Applied optics.
[13] J. Schwider,et al. New compensating four-phase algorithm for phase-shift interferometry , 1993 .
[14] T. Eiju,et al. Digital phase-shifting interferometry: a simple error-compensating phase calculation algorithm. , 1987, Applied optics.
[15] P. Carré. Installation et utilisation du comparateur photoélectrique et interférentiel du Bureau International des Poids et Mesures , 1966 .
[16] Y Surrel,et al. Design of algorithms for phase measurements by the use of phase stepping. , 1996, Applied optics.
[17] Bing Zhao,et al. Phase shifting: six-sample self-calibrating algorithm insensitive to the second harmonic in the fringe signal , 1995 .
[18] J. Schwider,et al. IV Advanced Evaluation Techniques in Interferometry , 1990 .
[19] Kieran G. Larkin,et al. Design and assessment of symmetrical phase-shifting algorithms , 1992 .
[20] J. Wyant. Use of an ac heterodyne lateral shear interferometer with real-time wavefront correction systems. , 1975, Applied optics.
[21] Kieran G. Larkin,et al. Efficient nonlinear algorithm for envelope detection in white light interferometry , 1996 .
[22] H Saint-Jalmes,et al. Multichannel Nomarski microscope with polarization modulation: performance and applications. , 1997, Optics letters.
[23] Y. Surrel. Phase stepping: a new self-calibrating algorithm. , 1993, Applied optics.
[24] B. Oreb,et al. Design and assessment of symmetrical phase-shifting algorithms , 1992 .
[25] Peter de Groot,et al. Derivation of algorithms for phase-shifting interferometry using the concept of a data-sampling window. , 1995, Applied optics.
[26] D W Phillion,et al. General methods for generating phase-shifting interferometry algorithms. , 1997, Applied optics.
[27] O. Sasaki,et al. Sinusoidal phase modulating interferometer using the integrating-bucket method. , 1987, Applied optics.
[28] Chris P. Brophy,et al. Effect of intensity error correlation on the computed phase of phase-shifting interferometry , 1990 .
[29] A C Boccara,et al. Real-time reflectivity and topography imagery of depth-resolved microscopic surfaces. , 1999, Optics letters.
[30] P. Flournoy,et al. White-light interferometric thickness gauge. , 1972, Applied optics.