Intercomparison of Terahertz Dielectric Measurements Using Vector Network Analyzer and Time-Domain Spectrometer

[1]  Nick Ridler,et al.  Commissioning of the NPL WR-05 waveguide network analyser system for S-parameter measurements from 140 GHz to 220 GHz. , 2015 .

[2]  Akifumi Kasamatsu,et al.  Development of Complex Relative Permittivity Measurement System Based on Free-Space in 220–330-GHz Range , 2015, IEEE Transactions on Terahertz Science and Technology.

[3]  Thorsten Schrader,et al.  Design and calibration of a compact quasi-optical system for material characterization in millimeter/sub-millimeter wave domain , 2014, 29th Conference on Precision Electromagnetic Measurements (CPEM 2014).

[4]  Thorsten Schrader,et al.  A reliable simple method to extract the intrinsic material properties in millimeter/sub-millimeter wave domain , 2014, 29th Conference on Precision Electromagnetic Measurements (CPEM 2014).

[5]  J. Coutaz,et al.  Sub-THz characterisation of multi-walled carbon nanotube thin films using vector network analyser , 2014 .

[6]  Robert Donnan,et al.  Accurate determination of terahertz optical constants by vector network analyzer of Fabry-Perot response. , 2013, Optics letters.

[7]  Alan Wilson,et al.  The Trace Is on Measurements: Developing Traceability for S?Parameter Measurements at Millimeter and Submillimeter Wavelengths , 2013, IEEE Microwave Magazine.

[8]  N.M. Ridler,et al.  Cross-connected waveguide lines as standards for millimeter- and submillimeter-wave vector network analyzers , 2013, 81st ARFTG Microwave Measurement Conference.

[9]  Johannes Hoffmann,et al.  Metas.UncLib—a measurement uncertainty calculator for advanced problems , 2012 .

[10]  J. Volakis,et al.  Validation of CW THz spectral measurements , 2012, Proceedings of the 2012 IEEE International Symposium on Antennas and Propagation.

[11]  Robert S. Donnan,et al.  Vector Network Analysis of Dielectric and Magnetic Materials in the Millimetre Wave Band , 2011 .

[12]  Xin-Ke Wang,et al.  Experimental characterization of hexaferrite ceramics from 100 GHz to 1 THz using vector network analysis and terahertz-time domain spectroscopy , 2011 .

[13]  Martin Salter,et al.  Traceability to national standards for S-parameter measurements in waveguide at frequencies from 140 GHz to 220 GHz , 2010, 2010 76th ARFTG Microwave Measurement Conference.

[14]  P. Kužel,et al.  Gouy shift correction for highly accurate refractive index retrieval in time-domain terahertz spectroscopy. , 2010, Optics express.

[15]  U. Hasar.  A Generalized Formulation for Permittivity Extraction of Low-to-High-Loss Materials From Transmission Measurement , 2010, IEEE Transactions on Microwave Theory and Techniques.

[16]  M. Thumm,et al.  Noninvasive Procedure for Measuring the Complex Permittivity of Resins, Catalysts, and Other Liquids Using a Partially Filled Rectangular Waveguide Structure , 2009, IEEE Transactions on Microwave Theory and Techniques.

[17]  B. Fischer,et al.  Uncertainty in terahertz time-domain spectroscopy measurement , 2008 .

[18]  M. Koch,et al.  Highly accurate optical material parameter determination with THz time-domain spectroscopy. , 2007, Optics express.

[19]  B. Fischer,et al.  Dynamic range in terahertz time-domain transmission and reflection spectroscopy. , 2005, Optics letters.

[20]  N. M. Ridler,et al.  A review of existing national measurement standards for RF and microwave impedance parameters in the UK. , 1999 .

[21]  G. F. Engen,et al.  Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network Analyzer , 1979 .

[22]  G.F. Engen,et al.  Thru-Load-Delay: An Improved Technique for Calibrating the Dual Six-Port , 1979, 1979 IEEE MTT-S International Microwave Symposium Digest.