论文信息 - Scanning Joule expansion microscopy at nanometer scales

Scanning Joule expansion microscopy at nanometer scales

We report a new technique called scanning Joule expansion microscopy that can simultaneously image surface topography and material expansion due to Joule heating with vertical resolution in the 1 pm range and lateral resolution similar to that of an atomic force microscope. By coating the sample with a polymer film, we demonstrate that sample temperature distribution can be directly measured without the need of fabricating temperature-sensing scanning probes.

A. Majumdar | J. Varesi

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