Just enough die-level test: optimizing ic test via machine learning and decision theory
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[1] Anthony P. Ambler,et al. Economics in design and test , 1993, Proceedings of 1993 IEEE International Conference on Computer Design ICCD'93.
[2] Thomas G. Dietterich. Machine-Learning Research Four Current Directions , 1997 .
[3] G. McLachlan,et al. The EM algorithm and extensions , 1996 .
[4] L. Milor,et al. A neural network based approach for surveillance and diagnosis of statistical parameters in IC manufacturing process , 1993, [1993 Proceedings] IEEE/SEMI International Semiconductor Manufacturing Science Symposium.
[5] Bruce D'Ambrosio,et al. Incremental Probabilistic Inference , 1993, UAI.
[6] Wolfgang Rosenstiel,et al. Analysis of electrical test data using a neural network approach , 1997, 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop ASMC 97 Proceedings.
[7] BuntineWray. A Guide to the Literature on Learning Probabilistic Networks from Data , 1996 .
[8] R. Hogarth,et al. BEHAVIORAL DECISION THEORY: PROCESSES OF JUDGMENT AND CHOICE , 1981 .
[9] Ronald A. Howard,et al. Dynamic Programming and Markov Processes , 1960 .
[10] R. K. Nurani,et al. Development of cost effective sampling strategy for in-line monitoring , 1997, 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop ASMC 97 Proceedings.
[11] Adrian F. M. Smith,et al. Sampling-Based Approaches to Calculating Marginal Densities , 1990 .
[12] Eric Horvitz,et al. Decision Analysis and Expert Systems , 1991, AI Mag..
[13] R. M. Dudley,et al. Influence Diagrams, Belief Nets and Decision Analysis. , 1991 .
[14] Zhaoyu Li,et al. Efficient inference in Bayes networks as a combinatorial optimization problem , 1994, Int. J. Approx. Reason..
[15] Edward J. Sondik,et al. The Optimal Control of Partially Observable Markov Processes over a Finite Horizon , 1973, Oper. Res..
[16] Wray L. Buntine. Operations for Learning with Graphical Models , 1994, J. Artif. Intell. Res..
[17] M. Crawford,et al. Yield enhancement techniques using neural network pattern detection , 1997, 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop ASMC 97 Proceedings.
[18] Susumu Kohyama. Semiconductor technology crisis and challenges towards the year 2000 , 1994, Proceedings of 1994 VLSI Technology Symposium.
[19] D. Yaffe,et al. Automatic Defect Classification Using Fuzzy Logic , 1993, Proceedings. IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop.
[20] J. D. Meindl. Opportunities for Gigascale Integration (GSI) Beyond 2003 , 1993, Proceedings. IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop.
[21] Roy E. Welsch,et al. Sequential Screening in Semiconductor Manufacturing, I: Exploiting Spatial Dependence , 1996, Oper. Res..
[22] Susan L. Albin,et al. The Impact of Clustered Defect Distributions in IC Fabrication , 1989 .
[23] Judea Pearl,et al. Probabilistic reasoning in intelligent systems , 1988 .
[24] J. Berger. Statistical Decision Theory and Bayesian Analysis , 1988 .
[25] Ross D. Shachter. Evaluating Influence Diagrams , 1986, Oper. Res..
[26] Judea Pearl,et al. Evidential Reasoning Using Stochastic Simulation of Causal Models , 1987, Artif. Intell..
[27] Ross D. Shachter,et al. Symbolic Probabilistic Inference in Belief Networks , 1990, AAAI.
[28] Stuart J. Russell,et al. Approximating Optimal Policies for Partially Observable Stochastic Domains , 1995, IJCAI.
[29] Samuel Holtzman,et al. Intelligent decision systems , 1988 .
[30] M. J. Maher. Finite Dynamic Programming , 1978 .
[31] A. Tversky,et al. The framing of decisions and the psychology of choice. , 1981, Science.
[32] D. Warner North,et al. A Tutorial Introduction to Decision Theory , 1968, IEEE Trans. Syst. Sci. Cybern..
[33] Vijayan N. Nair,et al. Monitoring wafer map data from integrated circuit fabrication processes for spatially clustered defects , 1997 .
[34] Leslie Pack Kaelbling,et al. Learning Policies for Partially Observable Environments: Scaling Up , 1997, ICML.
[35] Peter Norvig,et al. Artificial Intelligence: A Modern Approach , 1995 .
[36] Gregory F. Cooper,et al. An Empirical Analysis of Likelihood-Weighting Simulation on a Large, Multiply-Connected Belief Network , 1991, Computers and biomedical research, an international journal.
[37] Russell G. Almond,et al. Strategies for Graphical Model Selection , 1994 .
[38] David J. Spiegelhalter,et al. Local computations with probabilities on graphical structures and their application to expert systems , 1990 .
[39] H. Brachinger,et al. Decision analysis , 1997 .
[40] Ross D. Shachter,et al. Decision Making Using Probabilistic Inference Methods , 1992, UAI.
[41] Padhraic Smyth,et al. Stacked Density Estimation , 1997, NIPS.
[42] Michael P. Wellman,et al. Planning and Control , 1991 .
[43] Matthew Self,et al. Bayesian Classification , 1988, AAAI.
[44] David J. Spiegelhalter,et al. Bayesian analysis in expert systems , 1993 .
[45] Eugene Charniak,et al. Bayesian Networks without Tears , 1991, AI Mag..
[46] Max Henrion,et al. Search-Based Methods to Bound Diagnostic Probabilities in Very Large Belief Nets , 1991, UAI.
[47] Peter Cheeseman,et al. Bayesian classification theory , 1991 .
[48] Eric Horvitz,et al. Bounded Conditioning: Flexible Inference for Decisions under Scarce Resources , 2013, UAI 1989.
[49] Lawrence M. Wein,et al. Sequential Screening in Semiconductor Manufacturing, II: Exploiting Lot-to-Lot Variability , 1996, Oper. Res..
[50] L. Devroye. Non-Uniform Random Variate Generation , 1986 .
[51] Robert Zorich. Handbook of Quality Integrated Circuit Manufacturing , 1991 .
[52] Martin Abba Tanner,et al. Tools for Statistical Inference: Observed Data and Data Augmentation Methods , 1993 .
[53] Kenneth W. Tobin,et al. Adaptation of the fuzzy k-nearest neighbor classifier for manufacturing automation , 1998, Electronic Imaging.
[54] P. Castrucci,et al. The role of CIM for the fab of the future and custom IC manufacturing , 1994, Proceedings of 1994 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop (ASMC).
[55] W. Wong,et al. The calculation of posterior distributions by data augmentation , 1987 .
[56] Gregory F. Cooper,et al. A Method for Using Belief Networks as Influence Diagrams , 2013, UAI 1988.
[57] D. Rubin,et al. Maximum likelihood from incomplete data via the EM - algorithm plus discussions on the paper , 1977 .
[58] Sean Patrick Cunningham,et al. The Development and Use of In-line Yield Estimates in Semiconductor Manufacturing , 1995 .
[59] Michael Ghil,et al. Detecting Atmospheric Regimes Using Cross-Validated Clustering , 1997, KDD.
[60] Ross D. Shachter. An ordered examination of influence diagrams , 1990, Networks.
[61] D. J. White,et al. A Survey of Applications of Markov Decision Processes , 1993 .
[62] Himanshu Kumar,et al. Knowledge based testing , 1993, Proceedings of IEEE International Test Conference - (ITC).
[63] Donald Geman,et al. Stochastic Relaxation, Gibbs Distributions, and the Bayesian Restoration of Images , 1984, IEEE Transactions on Pattern Analysis and Machine Intelligence.
[64] David J. Spiegelhalter,et al. Sequential updating of conditional probabilities on directed graphical structures , 1990, Networks.
[65] J. A. Cunningham. The use and evaluation of yield models in integrated circuit manufacturing , 1990 .
[66] G. Casella,et al. Explaining the Gibbs Sampler , 1992 .