论文信息 - Optical characteristics of synchrotron sources and their influence in the simulation of X-ray topographs

Optical characteristics of synchrotron sources and their influence in the simulation of X-ray topographs

The optical characteristics of third–generation synchrotron sources and their influence on the simulation of X–ray topographs for various experimental settings, both for the Laue and Bragg case, are discussed. A new generation of simulation programs that allow easy modification of the model of deformation is described.

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