Device for testing life of semiconductor laser

The invention discloses a device for testing life of a semiconductor laser, comprising an optical platform, wherein the optical platform is provided with parallel guide rails and a laser water cooling array; the parallel guide rails are provided with electric translation tables; an integrating sphere and a PD (Power Detector) are fixed on the electric translation tables; the integrating sphere isconnected with a spectrograph through an optical fiber; the spectrograph is connected to an industrial personal computer; the PD is connected with the industrial personal computer through a collecting card; a temperature collecting module is arranged at the side of the laser water cooling array and connected with the industrial personal computer; the electric translation tables are connected witha translation table controller through controlling a cable; and the translation table controller is connected to the industrial personal computer. By the system, automatic parameter tests can be carried out on laser products with different packaging types, powers and numbers. The power and the spectral information of the laser products are automatically collected and recorded in the processing ofworking, the report printing data can be automatically carried out to form a test report, and therefore, the basis for failure analysis and research of the laser products is provided.