Reflectivity of VUV-sensitive silicon photomultipliers in liquid Xenon

Silicon photomultipliers are regarded as a very promising technology for next-generation, cutting-edge detectors for low-background experiments in particle physics. This work presents systematic reflectivity studies of Silicon Photomultipliers (SiPM) and other samples in liquid xenon at vacuum ultraviolet (VUV) wavelengths. A dedicated setup at the University of Münster has been used that allows to acquire angle-resolved reflection measurements of various samples immersed in liquid xenon with 0.45° angular resolution. Four samples are investigated in this work: one Hamamatsu VUV4 SiPM, one FBK VUV-HD SiPM, one FBK wafer sample and one Large-Area Avalanche Photodiode (LA-APD) from EXO-200. The reflectivity is determined to be 25–36 % at an angle of incidence of 20° for the four samples and increases to up to 65 % at 70° for the LA-APD and the FBK samples. The Hamamatsu VUV4 SiPM shows a decline with increasing angle of incidence. The reflectivity results will be incorporated in upcoming light response simulations of the nEXO detector.

A. K. Soma | M. Richman | Z. Li | F. Nolet | S. Parent | N. Roy | S. Charlebois | J. Pratte | S. Viel | V. Veeraraghavan | D. Schulte | T. Michel | G. Anton | L. Fabris | F. Retière | D. Moore | A. Piepke | G. Gratta | S. Al Kharusi | T. Brunner | E. Caden | A. Pocar | R. Saldanha | A. Odian | P. Gautam | R. DeVoe | J. Ringuette | M. Tarka | S. Rescia | J. Farine | B. Cleveland | R. Maclellan | M. Heffner | G. Giacomini | I. Ostrovskiy | M. Worcester | W. Yan | C. Weinheimer | C. Licciardi | G. Li | R. Tsang | T. Stiegler | D. Goeldi | A. Kuchenkov | I. Badhrees | V. Belov | C. Chambers | A. Craycraft | T. Daniels | A. Der Mesrobian-Kabakian | M. Dolinski | W. Fairbank | S. Feyzbakhsh | R. Gornea | E. Hansen | M. Hughes | A. Jamil | M. Jewell | A. Karelin | L. Kaufman | R. Krücken | Y. Lan | D. Leonard | S. Li | B. Mong | K. Murray | P. Rowson | V. Stekhanov | M. Wagenpfeil | U. Wichoski | O. Zeldovich | T. Ziegler | G. Cao | A. Bolotnikov | E. Raguzin | E. Angelico | E. Hoppe | T. Bhatta | L. Darroch | J. Echevers | D. Fairbank | A. Iverson | A. Larson | T. McElroy | O. Nusair | J. Todd | T. Totev | Q. Xia | P. Breur | E. Brown | A. Fieguth | M. Murra | I. Arnquist | J. Brodsky | S. Sangiorgio | M. L. di Vacri | S. Triambak | C. Hardy | A. Robinson | L. Yang | K. Leach | C. Natzke | J. Bane | K. Harouaka | J. Nattress | R. J. Newby | G. S. Ortega | A. House | D. Chernyak | F. Vachon | G. Gallina | A. De St. Croix | N. Massacret | S. Ferrara | R. Lindsay | C. Overman | L. Althueser | K. Odgers | B. Chana | M. Chiu | M. Elbeltagi | T. Rossignol | C. Vivo-Vilches | M. Walent | J. N. Nzobadila Ondze | D. Beck | K. Deslandes | G. Adhikari | S. Thibado | C. Huhmann | J. Orrell | J. Schneider | S.X. Wu | A. Gorham | P. Martel-Dion | G. J. Ramonnye | H. Rasiwala | A. Tidball | V. Veeraraghavan | R. MacLellan | C. Gingras | F. Spadoni | C. Richard | M. Medina Peregrina | K.S. Kumar | J. Nzobadila Ondze | A. Soma

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