Interrelation Between the Internal Quantum Efficiency and Forward Voltage of Blue LEDs

In InGaN/GaN multiple-quantum-well (MQW) light-emitting diodes (LEDs), carrier accumulation in MQWs due to the saturation of the radiative recombination rate affects the internal-quantum-efficiency (IQE) and forward-voltage (<inline-formula> <tex-math notation="LaTeX">${V} _{\text {F}}$ </tex-math></inline-formula>) characteristics simultaneously. In this letter, we investigate the interrelation between the IQE and <inline-formula> <tex-math notation="LaTeX">${V} _{\text {F}}$ </tex-math></inline-formula> at an operating current density, using 31 blue LEDs with MQW active layers grown under slightly different conditions. The general trend observed demonstrates that <inline-formula> <tex-math notation="LaTeX">${V} _{\text {F}}$ </tex-math></inline-formula> decreases as the IQE increases. We analyze this interrelation between the IQE and <inline-formula> <tex-math notation="LaTeX">${V} _{\text {F}}$ </tex-math></inline-formula> through separation of radiative and nonradiative current densities, and propose to use the active efficiency (AE) to quantify the performance of the active layer more precisely. We examine the two cases where only the radiative (nonradiative) current density changes and establish that the increase of the radiative current density is more desirable than the decrease of the nonradiative current density in improving the AE of the device.

[1]  J. Shim,et al.  Current–voltage characteristics of InGaN/GaN blue light-emitting diodes investigated by photovoltaic parameters , 2018, Japanese Journal of Applied Physics.

[2]  J. Shim,et al.  Measuring the internal quantum efficiency of light-emitting diodes: towards accurate and reliable room-temperature characterization , 2018, Nanophotonics.

[3]  J. Shim,et al.  Measuring the Internal Quantum Efficiency of Light-Emitting Diodes at an Arbitrary Temperature , 2018, IEEE Journal of Quantum Electronics.

[4]  J. Shim,et al.  Carrier accumulation in the active region and its impact on the device performance of InGaN-based light-emitting diodes , 2017 .

[5]  J. Shim,et al.  Effects of unbalanced carrier injection on the performance characteristics of InGaN light-emitting diodes , 2016 .

[6]  James S. Speck,et al.  The efficiency challenge of nitride light‐emitting diodes for lighting , 2015 .

[7]  J. Shim,et al.  Influence of carrier overflow on the forward-voltage characteristics of InGaN-based light-emitting diodes , 2014 .

[8]  E. Fred Schubert,et al.  Identifying the cause of the efficiency droop in GaInN light-emitting diodes by correlating the onset of high injection with the onset of the efficiency droop , 2013 .

[9]  E. Schubert,et al.  Efficiency droop in light‐emitting diodes: Challenges and countermeasures , 2013 .

[10]  Jong-In Shim,et al.  Investigation of Dominant Nonradiative Mechanisms as a Function of Current in InGaN/GaN Light-Emitting Diodes , 2013 .

[11]  Jong-In Shim,et al.  Study of droop phenomena in InGaN-based blue and green light-emitting diodes by temperature-dependent electroluminescence , 2012 .

[12]  Jong-In Shim,et al.  An Explanation of Efficiency Droop in InGaN-based Light Emitting Diodes: Saturated Radiative Recombination Rate at Randomly Distributed In-Rich Active Areas , 2011 .

[13]  E. F. Schubert,et al.  Current crowding in GaN/InGaN light emitting diodes on insulating substrates , 2001 .

[14]  W. Lanford,et al.  Low resistance Ti'Pt'Au ohmic contacts to p-type GaN , 2000 .

[15]  Nakamura,et al.  The roles of structural imperfections in InGaN-based blue light-emitting diodes and laser diodes , 1998, Science.