Fingerprinting Field Programmable Gate Arrays

The semiconductor industry has adopted a horizontal business model wherein one company designs the Integrated Circuits (ICs), a second company fabricates them and a third one tests and packages them. Separating design from fabrication introduces vulnerabilities in the IC supply chain. An offshore semiconductor foundry can overproduce FPGAs, and a malicious distributor can reinsert old, recycled and counterfeit FPGAs into the supply chain. We present an approach to fingerprint FPGAs by leveraging process variations and spatial correlations. We confirmed FPGA fingerprinting on 56 Xilinx Artix-7 FPGAs.

[1]  Matthew French,et al.  Intra-die process variation aware anomaly detection in FPGAs , 2014, 2014 International Test Conference.

[2]  Kenneth A. Peterson,et al.  Effects of focused ion beam irradiation on MOS transistors , 1997, 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual.

[3]  Ramesh Karri,et al.  FPGA Trust Zone: Incorporating trust and reliability into FPGA designs , 2016, 2016 IEEE 34th International Conference on Computer Design (ICCD).

[4]  Abhranil Maiti,et al.  Improved Ring Oscillator PUF: An FPGA-friendly Secure Primitive , 2011, Journal of Cryptology.

[5]  Mark Mohammad Tehranipoor,et al.  Aging analysis for recycled FPGA detection , 2014, 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).

[6]  G. Edward Suh,et al.  Physical Unclonable Functions for Device Authentication and Secret Key Generation , 2007, 2007 44th ACM/IEEE Design Automation Conference.

[7]  P. Danielsson.  Euclidean distance mapping , 1980 .

[8]  Ujjwal Guin,et al.  Counterfeit IC Detection and Challenges Ahead , 2013 .

[9]  Srinivas Devadas,et al.  FPGA PUF using programmable delay lines , 2010, 2010 IEEE International Workshop on Information Forensics and Security.