Application of Elliptic Fourier Descriptors to Symmetry Detection Under Parallel Projection

In this paper, the method of elliptic Fourier descriptors using arc length parameterization is applied to tackle the problem of detection and recovery of symmetry under parallel projection. A simple and fast iteration algorithm together with the invariants of symmetry provides sufficient information for the detection and recovery of symmetry under parallel projection. The proposed method has been extensively tested using symmetric figures under different parallel projections. Simulation results of the algorithm are presented. The extension of this method for planar object recognition under parallel projection is also addressed. >

[1]  Guy L. Scott,et al.  The Alternative Snake - and Other Animals , 1987, Alvey Vision Conference.

[2]  Swapan K. Parui,et al.  Symmetry analysis by computer , 1983, Pattern Recognit..

[3]  Gösta H. Granlund,et al.  Fourier Preprocessing for Hand Print Character Recognition , 1972, IEEE Transactions on Computers.

[4]  Ralph Roskies,et al.  Fourier Descriptors for Plane Closed Curves , 1972, IEEE Transactions on Computers.

[5]  Charles R. Giardina,et al.  Elliptic Fourier features of a closed contour , 1982, Comput. Graph. Image Process..

[6]  Adolfo Guzman,et al.  Decomposition of a visual scene into three-dimensional bodies , 1968 .

[7]  Wesley E. Snyder,et al.  Application of Affine-Invariant Fourier Descriptors to Recognition of 3-D Objects , 1990, IEEE Trans. Pattern Anal. Mach. Intell..

[8]  Alan L. Yuille,et al.  An Extremum Principle for Shape from Contour , 1983, IEEE Transactions on Pattern Analysis and Machine Intelligence.

[9]  P. Wintz,et al.  An efficient three-dimensional aircraft recognition algorithm using normalized fourier descriptors , 1980 .

[10]  Mikhail J. Atallah,et al.  On Symmetry Detection , 1985, IEEE Transactions on Computers.

[11]  Stuart A. Friedberg,et al.  Finding axes of skewed symmetry , 1986, Comput. Vis. Graph. Image Process..

[12]  Chun-Shin Lin,et al.  New forms of shape invariants from elliptic fourier descriptors , 1987, Pattern Recognit..

[13]  Thomas R. Crimmins.  A Complete Set of Fourier Descriptors for Two-Dimensional Shapes , 1982, IEEE Transactions on Systems, Man, and Cybernetics.

[14]  Jin-Jang Leou,et al.  Automatic rotational symmetry determination for shape analysis , 1987, Pattern Recognit..

[15]  Vishvjit S. Nalwa.  Line-Drawing Interpretation: Bilateral Symmetry , 1989, IEEE Trans. Pattern Anal. Mach. Intell..

[16]  Takeo Kanade,et al.  Recovery of the Three-Dimensional Shape of an Object from a Single View , 1981, Artif. Intell..

[17]  Giovanni Marola,et al.  On the Detection of the Axes of Symmetry of Symmetric and Almost Symmetric Planar Images , 1989, IEEE Trans. Pattern Anal. Mach. Intell..

[18]  King-Sun Fu,et al.  Shape Discrimination Using Fourier Descriptors , 1977, IEEE Transactions on Pattern Analysis and Machine Intelligence.

[19]  Harry G. Barrow,et al.  Interpreting Line Drawings as Three-Dimensional Surfaces , 1980, Artif. Intell..