RELIABILITY TEST DEMONSTRATION METHOD FOR EXPONENTIAL LIFE SYSTEM WITH RELIABILITY GROWTH UNDER THE CONDITION OF IN-TIME CORRECTIVE STRATEGY

The development process of weapon system usually composes of multiple test stages. Especially for expensive weapon system which test is destructive, engineers often apply In-Time corrective strategy to analyze and modify failures exposed during development. That is to say once failure is observed at each stage, test is then stopped and a design modification is introduced to remove the cause of the observed failure, and thus release improved system to new test stage until the system reliability level satisfy the predefined development requirement. In this paper, we present a Bayesian statistical decision method to judge whether system reliability level meet development requirement or not, based on multiple stages test data during development of exponential life system and taking In-Time corrective strategy into account. Firstly, the reliability growth model, derived from non-homogeneous Poisson process, under the condition of In-Time corrective strategy is presented. Then prior distribution of system reliability index is introduced by applying reliability growth model to incorporate various test data from development process, and the Bayesian hypothesis testing method is given. Finally, the numerical example validates effectivity of the method compared with traditional methods.