Direct print EUV patterning of tight pitch metal layers for Intel 18A process technology node
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K. Fischer | R. Bigwood | N. Moumen | C. Wallace | R. Venkatesan | M. Aykol | P. Gupta | Z. Zhang | R. Rodriguez | D. Bhawe | C. Guven | B. Bains | A. R. Greenwood | P. Saksena