Recursive parameter estimation for categorical process control
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[1] Bill Bolstad. Bayesian Process Monitoring, Control and Optimization edited by Enrique del Castillo, Bianca M. Colosimo , 2007 .
[2] Enrique Del Castillo,et al. Long run and transient analysis of a double EWMA feedback controller , 1999 .
[3] Chin-Yao Low,et al. Design for an SPRT control scheme based on linguistic data , 2003 .
[4] F. Franceschini,et al. Synthesis maps for multivariate ordinal variables in manufacturing , 2006 .
[5] Costas J. Spanos,et al. Using qualitative observations for process tuning and control [IC manufacture] , 1997 .
[6] C.-H. Jen,et al. General run-to-run (R2R) control framework using self-tuning control for multiple-input multiple-output (MIMO) processes , 2004 .
[7] W. Woodall,et al. A probabilistic and statistical view of fuzzy methods , 1995 .
[8] Daniel W. Apley,et al. Cautious Control of Industrial Process Variability With Uncertain Input and Disturbance Model Parameters , 2004, Technometrics.
[9] Arnon M. Hurwitz,et al. Run-to-Run Process Control: Literature Review and Extensions , 1997 .
[10] Shu-Kai S. Fan,et al. SISO run-to-run feedback controller using triple EWMA smoothing for semiconductor manufacturing processes , 2002 .
[11] Yick Chuen Chan,et al. High-throughput design and fabrication of an integrated microsystem with high aspect-ratio sub-micron pillar arrays for free-solution micro capillary electrophoresis , 2006 .
[12] Armann Ingolfsson,et al. Stability and Sensitivity of an EWMA Controller , 1993 .
[13] Bianca Maria Colosimo,et al. Bayesian Process Monitoring, Control and Optimization , 2006 .
[14] E. Del Castillo,et al. Statistical process adjustment: A brief retrospective, current status, and some opportunities for further work , 2006 .
[15] William R. Rodgers,et al. Extrusion processing of TPO nanocomposites , 2004 .
[16] B. M. Colosimo,et al. Setup adjustment for discrete-part manufacturing processes with asymmetric cost functions , 2005 .
[17] Fugee Tsung,et al. Run-to-Run Process Adjustment Using Categorical Observations , 2007 .
[18] Fugee Tsung,et al. A study of variable EWMA controller , 2003 .
[19] S. W. Butler,et al. Supervisory run-to-run control of polysilicon gate etch using in situ ellipsometry , 1994 .
[20] Donald Geman,et al. Stochastic Relaxation, Gibbs Distributions, and the Bayesian Restoration of Images , 1984, IEEE Transactions on Pattern Analysis and Machine Intelligence.