Recent advances in microwave analog to light scattering experiments

Abstract This review article describes recent advances we have made over the last decade in the field of microwave analog to light scattering experiments and provides trends that we foresee for future developments. First, we have tried to build more controlled and complex-shaped analog particles using rapid prototyping technologies. Second, we have made 3D measurements and have increased their sensitivity, i.e. measurements have been made for targets with ever smaller sizes. At last, we have explored the possibilities of making measurements in the near-field and have developed a new device to investigate evanescent wave scattering by targets placed on a planar substrate. As new illustrations of these recent progresses, we provide previously unreleased results, such as measurements showing the impact of monomer overlap in aggregates on one element of the amplitude scattering matrix.

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