Defect Inspection of the Polarizer Film Using Singular Vector Decomposition

In this paper, we propose a global approach for automatic inspection of defects in the polarizer film image. The proposed method does not rely on local feature of the defect. It is based on a global image reconstruction scheme using the singular value decomposition(SVD). SVD is used to decompose the image and then obtain a diagonal matrix of the singular values. Among the singular values, the first singular value is used to reconstruct a image. In reconstructed image, the normal pixels in background region have a different characteristics from the pixels in defect region. It is obtained the ratio of pixels in the reconstructed image to ones in the original image and then the defects are detected based on the the statistical process of the ratio. The experiment results show that the proposed method is efficient for defect inspection of polarizer lam image.