Bayesian Analysis of Reliability Growth Test Based on Weibull Process

In the Bayesian analysis of reliability growth test based on Weibull process, the Bayesian posterior distributions of some key parameters in the time truncated test is first developed. Then, by assuming the prior distribution of the expectation exception list in the truncated time to have the Gamma distribution form, thus a concise posterior distribution form is obtained. When using this result to carry out the reliability evaluation, the conversion of prior information and the estimation of failure intensity's posterior distribution are realized in the principle of moment equivalence. The simulation shows that this method can obtain believable evaluation results with reliable precision.