Negative Bias Temperature Instability: Estimation and Design for Improved Reliability of Nanoscale Circuits
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Kaushik Roy | Bipul Chandra Paul | Kunhyuk Kang | Haldun Kufluoglu | Muhammad Ashraful Alam | B. Paul | M. Alam | H. Kufluoglu | K. Roy | Kunhyuk Kang
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