A Survey of Radiation Hardened Microelectronic Memory Technology

A study was performed to identify needed research and development in radiation hardened microelectronic memory technology. A review was made of the requirements for memories, the state-of-the-art of mature memory technologies, the trends in the development of unhardened commercial memory technologies, and the current technology gaps facing memory technologies and their prospects for solution. The main conclusion of the study is that the greatest need is for hardened nonvolatile MNOS and Bubble memories, but that these technologies have many difficult technology gaps to overcome. Strategies for research and development on these technologies are given. If this research and development is successful in overcoming these gaps, the positions of MNOS and bubble memories in both the military and commercial market will be greatly enhanced. The advantages of nonvolatility will insure for these technologies the large production base needed to establish confidence in the use of these memory technologies.

[1]  Roger Allan Solid-state devices: Amorphous semiconductors revisited: Despite residual skepticism, they've been successfully used in memory, microfiche, and graphic-arts applications , 1977, IEEE Spectrum.

[2]  T. May,et al.  A New Physical Mechanism for Soft Errors in Dynamic Memories , 1978, 16th International Reliability Physics Symposium.

[3]  Takashi Ito,et al.  Thermally grown silicon nitride films for high-performance MNS devices , 1978 .

[4]  G. Derbenwick,et al.  Prevention of CMOS Latch-Up by Gold Doping , 1976, IEEE Transactions on Nuclear Science.

[5]  G. Brucker Characteristics of CMOS/Bulk and SOS Memories in a Transient Environment , 1977, IEEE Transactions on Nuclear Science.

[6]  D. Toombs,et al.  Solid state: An update: CCD and bubble memories: Commercial units include 64-kbit charge-coupied-device and 92-kbit magnetic-bubble memories , 1978, IEEE Spectrum.

[7]  L. L. Sivo,et al.  Radiation Hardness of CMOS LSI Circuits , 1977, IEEE Transactions on Nuclear Science.

[8]  David K. Myers Radiation Effects on Commercial 4-Kilobit NMOS Memories , 1976, IEEE Transactions on Nuclear Science.

[9]  Harold Borkan,et al.  Radiation Hardening of CMOS Technologies - AN Overview , 1977, IEEE Transactions on Nuclear Science.

[10]  J. P. Raymond,et al.  A Comparative Evaluation of Integrated Injection Logic , 1977, IEEE Transactions on Nuclear Science.

[11]  E. A. Torrero Solid-state devices: Memories and microprocessors benefit from large-scale integration advances , 1978, IEEE Spectrum.