All-silicon avalanche photodiode sensitive at 1.3 mu m with picosecond time resolution

The first experimental demonstration that an all-silicon photodiode can be used to measure the pulse shape of laser diodes emitting at 1.3 mu m is reported. In order to allow for light absorption at these wavelengths, the bandgap narrowing phenomenon in heavily doped silicon is exploited. The device operates as a single photon detector in a time-correlated photon counting setup. The quantum efficiency of the detector (though only 10/sup -7/), together with the very low noise ( approximately=100 dark pulses per second) enable easy measurements on standard diode lasers. The use of standard silicon processing and the room-temperature operation are definite advantages of the device. >

[1]  P. Aigrain,et al.  Optical Absorption of Arsenic-Doped Degenerate Germanium , 1962 .

[2]  M. Chester,et al.  Electric Field Effects on Indirect Optical Transitions in Silicon , 1965 .

[3]  W. Oldham,et al.  Triggering phenomena in avalanche diodes , 1972 .

[4]  M. Bertolaccini,et al.  The measurement of luminescence waveforms by single‐photon techniques , 1973 .

[5]  Walter Fichtner,et al.  Time resolution of Ge avalanche photodiodes operating as photon counters in delayed coincidence , 1976 .

[6]  P. Schmid,et al.  Optical absorption in heavily doped silicon , 1981 .

[7]  W. Dumke Comparison of band‐gap shrinkage observed in luminescence from n+‐Si with that from transport and optical absorption measurements , 1983 .

[8]  B. F. Levine,et al.  Single photon detection at 1.3 μm using a gated avalanche photodiode , 1984 .

[9]  J. A. del Alamo,et al.  Measuring and modeling minority carrier transport in heavily doped silicon , 1985 .

[10]  Joe C. Campbell,et al.  Room‐temperature 1.3‐μm optical time domain reflectometer using a photon counting InGaAs/InP avalanche detector , 1985 .

[11]  J. Wagner Heavily doped silicon studied by luminescence and selective absorption , 1985 .

[12]  Wagner Band-gap narrowing in heavily doped silicon at 20 and 300 K studied by photoluminescence. , 1985, Physical review. B, Condensed matter.

[13]  R. Soref,et al.  All-silicon active and passive guided-wave components for λ = 1.3 and 1.6 µm , 1986 .

[14]  Jesus A. del Alamo,et al.  Band‐gap narrowing in heavily doped silicon: A comparison of optical and electrical data , 1988 .

[15]  S. Suzuki,et al.  Ultrafast microchannel plate photomultipliers. , 1988, Applied optics.

[16]  A. Lacaita,et al.  20 picosecond resolution single-photon solid-state detector , 1989 .

[17]  Andrea L. Lacaita,et al.  20-ps timing resolution with single-photon avalanche diodes , 1989 .

[18]  Massimo Ghioni,et al.  Photon-timing OTDR: a multiphoton backscattered pulse approach , 1990 .

[19]  David J. Roulston,et al.  A simple expression for band gap narrowing (BGN) in heavily doped Si, Ge, GaAs and GexSi1−x strained layers , 1991 .