Ion implantation induced disorder in single-crystal and sputter-deposited polycrystalline CdTe characterized by ellipsometry and backscattering spectrometry
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N. Khánh | T. Lohner | M. Fried | P. Petrik | G. Radnóczi | Jian Li | R. Collins | Jie Chen | J. Gyulai | N. Q. Khánh