论文信息 - First results in micromapping the sensitivity to SEE of an electronic device in a SOI technology at the LNL IEEM - 字舞流文

First results in micromapping the sensitivity to SEE of an electronic device in a SOI technology at the LNL IEEM

D. Bisello | P. Giubilato | S. Mattiazzo | J. Wyss | D. Pantano | M. Tessaro | L. Silvestrin | A. Kaminsky