The Electromagnetic Compatibility of Integrated Circuits—Past, Present, and Future
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T.H. Hubing | M. Ramdani | O. Wada | S. Ben Dhia | E. Sicard | A. Boyer | J.J. Whalen | M. Coenen | T. Hubing | J. Whalen | A. Boyer | E. Sicard | S. Ben Dhia | O. Wada | M. Ramdani | M. Coenen
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