A common approach to test generation and hardware verification based on temporal logic
暂无分享,去创建一个
[1] Alexander Miczo,et al. The Sequential ATPG: A Theoretical Limit , 1983, International Test Conference.
[2] Howard Barringer,et al. Formal specification and verification of hardware: a comparative case study , 1988, 25th ACM/IEEE, Design Automation Conference.Proceedings 1988..
[3] David Bryan,et al. Combinational profiles of sequential benchmark circuits , 1989, IEEE International Symposium on Circuits and Systems,.
[4] A. Sangiovanni-Vincentelli,et al. Irredundant sequential machines via optimal logic synthesis , 1990, Twenty-Third Annual Hawaii International Conference on System Sciences.
[5] Thomas W. Williams,et al. A logic design structure for LSI testability , 1977, DAC '77.
[6] Gregor von Bochmann. Hardware Specification with Temporal Logic: An Example , 1982, IEEE Transactions on Computers.
[7] G. Venkatesh,et al. Reasoning about Digital Systems Using Temporal Logic , 1986, 23rd ACM/IEEE Design Automation Conference.
[8] Thomas Kropf,et al. Structure in Hardware Proofs: First Steps Towards Automation in a Higher-Order Environment , 1991, VLSI.
[9] Hans-Joachim Wunderlich,et al. The pseudoexhaustive test of sequential circuits , 1989, Proceedings. 'Meeting the Tests of Time'., International Test Conference.
[10] Pierre Wolper. Temporal Logic Can Be More Expressive , 1983, Inf. Control..
[11] Olivier Coudert,et al. Verification of Synchronous Sequential Machines Based on Symbolic Execution , 1989, Automatic Verification Methods for Finite State Systems.
[12] Randal E. Bryant,et al. Graph-Based Algorithms for Boolean Function Manipulation , 1986, IEEE Transactions on Computers.
[13] Edmund M. Clarke,et al. Sequential circuit verification using symbolic model checking , 1991, DAC '90.
[14] Michael H. Schulz,et al. SOCRATES: a highly efficient automatic test pattern generation system , 1988, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
[15] Michael J. C. Gordon,et al. Why higher-order logic is a good formalism for specifying and verifying hardware , 1985 .
[16] W.-T. Cheng,et al. The BACK algorithm for sequential test generation , 1988, Proceedings 1988 IEEE International Conference on Computer Design: VLSI.
[17] Randal E. Bryant,et al. Test Pattern Generation for Sequential MOS Circuits by Symbolic Fault Simulation , 1989, 26th ACM/IEEE Design Automation Conference.
[18] Paolo Prinetto,et al. Formal verification of hardware correctness: introduction and survey of current research , 1988, Computer.
[19] Edmund M. Clarke,et al. Representing circuits more efficiently in symbolic model checking , 1991, 28th ACM/IEEE Design Automation Conference.
[20] Arno Kunzmann,et al. An analytical approach to the partial scan problem , 1990, J. Electron. Test..
[21] Robert K. Brayton,et al. Implicit state enumeration of finite state machines using BDD's , 1990, 1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers.
[22] Randal E. Bryant,et al. Efficient implementation of a BDD package , 1991, DAC '90.
[23] Hans-Joachim Wunderlich,et al. The design of random-testable sequential circuits , 1989, [1989] The Nineteenth International Symposium on Fault-Tolerant Computing. Digest of Papers.
[24] Hans-Joachim Wunderlich,et al. Generating pseudo-exhaustive vectors for external testing , 1990, Proceedings. International Test Conference 1990.
[25] Ralph A. Marlett. An Effective Test Generation System for Sequential Circuits , 1986, DAC 1986.
[26] Michael H. Schulz,et al. ESSENTIAL: an efficient self-learning test pattern generation algorithm for sequential circuits , 1989, Proceedings. 'Meeting the Tests of Time'., International Test Conference.
[27] Vishwani D. Agrawal,et al. An economical scan design for sequential logic test generation , 1989, [1989] The Nineteenth International Symposium on Fault-Tolerant Computing. Digest of Papers.
[28] James B. Angell,et al. Enhancing Testability of Large-Scale Integrated Circuits via Test Points and Additional Logic , 1973, IEEE Transactions on Computers.
[29] Robert S. Boyer,et al. The Correctness Problem in Computer Science , 1982 .
[30] Seh-Woong Jeong,et al. ATPG aspects of FSM verification , 1990, 1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers.
[31] Zohar Manna,et al. Verification of concurrent programs, Part I: The temporal framework , 1981 .
[32] Tom Melham,et al. Abstraction Mechanisms for Hardware Verification , 1988 .
[33] Edmund M. Clarke,et al. Symbolic Model Checking: 10^20 States and Beyond , 1990, Inf. Comput..
[34] Edward A. Feigenbaum,et al. Switching and Finite Automata Theory: Computer Science Series , 1990 .
[35] Fabio Somenzi,et al. Fast sequential ATPG based on implicit state enumeration , 1991, 1991, Proceedings. International Test Conference.