Migration from an AlGaAs to an InGaP emitter HBT IC process for improved reliability
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N. Pan | D. D'Avanzo | N. Pan | P. Canfield | D.C. D'Avanzo | T. Low | C. Hutchinson | T. Shirley | R. Yeats | J.S.C. Chang | G. Essilfie | M. Culver | W. Whiteley | J. Elliot | C. Lutz | T.S. Low | R.E. Yeats | G.K. Essilfie | J.S.C. Chang | C.P. Hutchinson | M.K. Culver | P.C. Canfield | T.S. Shirley | W.C. Whiteley | J. Elliot | C. Lutz | W.C. Whiteley
[1] T. Fujii,et al. Current status of reliability of InGaP/GaAs HBTs , 1997 .