Democratizing an electroluminescence imaging apparatus and analytics project for widespread data acquisition in photovoltaic materials.

We present a description of an electroluminescence (EL) apparatus, easily sourced from commercially available components, with a quantitative image processing platform that demonstrates feasibility for the widespread utility of EL imaging as a characterization tool. We validated our system using a Gage R&R analysis to find a variance contribution by the measurement system of 80.56%, which is typically unacceptable, but through quantitative image processing and development of correction factors a variance contribution by the measurement system of 2.41% was obtained. We further validated the system by quantifying the signal-to-noise ratio (SNR) and found values consistent with other systems published in the literature, at SNR values of 10-100, albeit at exposure times of greater than 1 s compared to 10 ms for other systems. This SNR value range is acceptable for image feature recognition, providing the opportunity for widespread data acquisition and large scale data analytics of photovoltaics.

[1]  Carsten Schinke,et al.  Experimental setup for camera-based measurements of electrically and optically stimulated luminescence of silicon solar cells and wafers. , 2011, The Review of scientific instruments.

[2]  Mohammadreza Aghaei,et al.  Unmanned Aerial Vehicles in Photovoltaic Systems Monitoring Applications , 2014 .

[3]  Felix Haase,et al.  Model of Cracked Solar Cell Metallization Leading to Permanent Module Power Loss , 2016, IEEE Journal of Photovoltaics.

[4]  Wolfgang Huber,et al.  EBImage—an R package for image processing with applications to cellular phenotypes , 2010, Bioinform..

[5]  Wai-Yim Ching,et al.  van der Waals Interactions on the Mesoscale: Open-Science Implementation, Anisotropy, Retardation, and Solvent Effects. , 2015, Langmuir : the ACS journal of surfaces and colloids.

[6]  Gernot M. Wallner,et al.  Correlation of spatially resolved photoluminescence and viscoelastic mechanical properties of encapsulating EVA in differently aged PV modules , 2016 .

[7]  Wilhelm Warta,et al.  Determination of local minority carrier diffusion lengths in crystalline silicon from luminescence images , 2009 .

[8]  Wilhelm Warta,et al.  Diffusion lengths of silicon solar cells from luminescence images , 2007 .

[9]  Thorsten Trupke,et al.  On the detection of shunts in silicon solar cells by photo‐ and electroluminescence imaging , 2008 .

[10]  David Hinken,et al.  Recombination current and series resistance imaging of solar cells by combined luminescence and lock-in thermography , 2007 .

[11]  Ichizo Uchida.  Observation of the Recombination Radiation from Silicon p-n Junction , 1963 .

[12]  Andrew G. Glen,et al.  APPL , 2001 .

[13]  Wilhelm Warta,et al.  Luminescence imaging for the detection of shunts on silicon solar cells , 2008 .

[14]  David Hinken,et al.  Series resistance imaging of solar cells by voltage dependent electroluminescence , 2007 .

[15]  David Hinken,et al.  Determination of the effective diffusion length of silicon solar cells from photoluminescence , 2009 .

[16]  Wilhelm Warta,et al.  Spatially resolved determination of dark saturation current and series resistance of silicon solar cells , 2010 .

[17]  Laura S. Bruckman,et al.  Degradation science: Mesoscopic evolution and temporal analytics of photovoltaic energy materials , 2015 .

[18]  Yang Hu,et al.  Insights into metastability of photovoltaic materials at the mesoscale through massive I–V analytics , 2016 .

[19]  Thorsten Trupke,et al.  Spatially resolved series resistance of silicon solar cells obtained from luminescence imaging , 2007 .

[20]  Thorsten Trupke,et al.  Advanced luminescence based effective series resistance imaging of silicon solar cells , 2008 .

[21]  R Core Team,et al.  R: A language and environment for statistical computing. , 2014 .

[22]  D. Montgomery,et al.  Design and analysis of gauge R&R studies : making decisions with confidence intervals in random and mixed ANOVA models , 2005 .