Laser Measurement Techniques - Laser Spectroscopy In Semiconductors

A CAMAC-based digital data acquisition system to study luminescence spectra and dynamics in semiconductors using pulsed and cw laser sources is described. Various experimental techniques for measuring time-dependent luminescence and laser excitation spectra are discussed. In order to demonstrate the system performance and sensitivity of this data acquisition system, experimental low-temperature laser-induced luminescence data for the oxygen-bound exciton in the II-VI semiconductor compound ZnTe is presented.