Digitalized Analysis of Open-faced Mobile Phone Damage Caused by Falling

Free-drop response is a main item of environmental examinations for electronic products.The examination is always performed in the anaphase of a product development.With the development of digital technology,finite element model can be set up in the design phase of a product.Through simulation analysis of a product,the falling response for the components of the product and the locations where damages occur in the course of falling can be obtained.In this paper,an open-faced mobile phone is used to study the influence of falling on the damage of phone's parts such as shell,screen and so on.The relevant improvement measures are proposed.The study is of benefit for the improvement of the phone structure,reducing the number of prototype physical experiments and shortening product development cycle.