Surface resistance measurements of HTS films by means of sapphire dielectric resonators
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J. Modelski | J. Krupka | J. Krupka | J. Modelski | M. Klinger | M. Kuhn | A. Baryanyak | M. Stiller | J. Hinken | J. Hinken | M. Klinger | M. Kuhn | A. Baryanyak | M. Stiller
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