Comparison between high-field piezoresistance coefficients of Si metal-oxide-semiconductor field-effect transistors and bulk Si under uniaxial and biaxial stress
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Scott E. Thompson | Toshikazu Nishida | S. Thompson | T. Nishida | M. Chu | Min Chu | Xiaoliang Lv | Xiaoliang Lv | Nidhi Mohta | N. Mohta
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