Multiline material parameter extraction method performance analysis

This paper presents a performance analysis of a multiline material parameter extraction method. The multiline method is a newly developed technique for the characterization of printable electronics structures and integrated microwave structures, with dramatically improved accuracy of the extracted material parameters. An analysis of the performance of three error-box models used with the multiline material parameter extraction method in characterizing printable electronics structures is presented. The effects of variations in the conductivity and dimensions of the transmission lines on the performance of the multiline extraction method are investigated. The characterization method is validated with the error-box models using fullwave simulation data, after which it is applied to the characterization of printed electronics structures. Compared to traditional characterization methods, greatly improved accuracy is achieved over a frequency range of 0–20 GHz.

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