Results of network analyzer measurements with leakage errors-corrected with direct calibration techniques
暂无分享,去创建一个
[1] B. Schiek,et al. A generalized theory and new calibration procedures for network analyzer self-calibration , 1991 .
[2] Burkhard Schiek,et al. Robust algorithms for Txx network analyzer self-calibration procedures , 1994 .
[3] K. J. Silvonen. Calibration of 16-term error model (microwave measurement) , 1993 .
[4] R. D. Pollard,et al. 16-term error model and calibration procedure for on wafer network analysis measurements (MMICs) , 1991 .
[5] Norman R. Franzen,et al. A New Procedure for System Calibration and Error Removal in Automated S-Parameter Measurements , 1975, 1975 5th European Microwave Conference.
[6] A. Davidson,et al. Achieving greater on-wafer S-parameter accuracy with the LRM calibration technique , 1989, 34th ARFTG Conference Digest.
[7] Holger Heuermann. Sure Methods of On-Wafer Scattering Parameter Measurements with Self-Calibration Procedures , 1996, 47th ARFTG Conference Digest.
[8] R. A. Speciale. A Generalization of the TSD Network-Analyzer Calibration Procedure, Covering n-Port Scattering-Parameter Measurements, Affected by Leakage Errors , 1977 .
[9] Holger Heuermann,et al. Results of network analyzer measurements with leakage errors corrected with the TMS-15-term procedure , 1994, 1994 IEEE MTT-S International Microwave Symposium Digest (Cat. No.94CH3389-4).
[10] G. F. Engen,et al. Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network Analyzer , 1979 .
[11] H. Van Hamme,et al. Flexible vector network analyzer calibration with accuracy bounds using an 8-term or a 16-term error correction model , 1994 .