Concurrent Error Detection in Reed–Solomon Encoders and Decoders
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[1] Cheng-Wen Wu,et al. On-line error detection schemes for a systolic finite-field inverter , 1998, Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259).
[2] M. Anwar Hasan,et al. Concurrent error detection of polynomial basis multiplication over extension fields using a multiple-bit parity scheme , 2005, 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05).
[3] Edward J. McCluskey,et al. Design techniques for testable embedded error checkers , 1990, Computer.
[4] M. Anwar Hasan,et al. Error Detection in Polynomial Basis Multipliers over Binary Extension Fields , 2002, CHES.
[5] Donatella Sciuto,et al. A novel methodology for designing TSC networks based on the parity bit code , 1997, Proceedings European Design and Test Conference. ED & TC 97.
[6] J.L. Massey,et al. Theory and practice of error control codes , 1986, Proceedings of the IEEE.
[7] I. M. Boyarinov. Self-checking algorithm of solving the key equation , 1998, Proceedings. 1998 IEEE International Symposium on Information Theory (Cat. No.98CH36252).
[8] Michael Gössel,et al. On-line error detection for finite field multipliers , 1997, 1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.
[9] M. Anwar Hasan,et al. Low complexity bit parallel architectures for polynomial basis multiplication over GF(2m) , 2004, IEEE Transactions on Computers.
[10] Salvatore Pontarelli,et al. Design of a self checking Reed Solomon encoder , 2005, 11th IEEE International On-Line Testing Symposium.
[11] Parag K. Lala,et al. Fault tolerant and fault testable hardware design , 1985 .
[12] Salvatore Pontarelli,et al. A self checking Reed Solomon encoder: design and analysis , 2005, 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05).
[13] Sterling R. Whitaker,et al. An ultra-low-power, radiation-tolerant Reed Solomon encoder for space applications , 2003, Proceedings of the IEEE 2003 Custom Integrated Circuits Conference, 2003..