Characterization of high resolution DAC by DFT and sine fitting

The research concerns with the evaluation of the dynamic performances of the DAC by analysing, in the frequency domain, the estimated output signal characterised by non uniform sampling. The non uniform sampling is caused by the method used to acquire the signal with both high resolution and linearity. On the basis of this characteristic, the signal processing in the frequency domain by tradition procedures brings non correct information. In order to overcome this problem two different analysis procedures are taken into account able to correctly process the non uniformly sampled signal. One is based on the discrete Fourier transform modified to be used in the case of non uniformly sampled signal. Another one is based on the multi-sine fitting algorithm modified according to the procedure presented in the paper. The performances of both the two analysis procedures are evaluated and highlighted. In particular, the accuracy of two analysis procedures is compared to evaluate the total harmonic distortion and the spurious free dynamic range in various experimental conditions.

[1]  D. Grimaldi,et al.  Static Characterization of High Resolution DAC Based on Over Sampling and Low Resolution ADC , 2007, 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007.

[2]  Raul Carneiro Martins,et al.  Simulation and experimental results of multiharmonic least-squares fitting algorithms applied to periodic signals , 2006, IEEE Transactions on Instrumentation and Measurement.

[3]  Dan J. Kien A second look at IEEE std 1057—IEEE standard for digitizing waveform analyzers , 2000 .

[4]  J. Schoukens,et al.  Using reduced-order models in D/A converter testing , 2002, IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276).

[5]  J. Steensgaard High-resolution mismatch-shaping digital-to-analog converters , 2001, ISCAS 2001. The 2001 IEEE International Symposium on Circuits and Systems (Cat. No.01CH37196).

[6]  Yih-Chyun Jenq,et al.  Digital spectrum of a nonuniformly sampled two-dimensional signal and its reconstruction , 2005, IEEE Trans. Instrum. Meas..

[7]  Gordon W. Roberts,et al.  An Introduction to Mixed-Signal IC Test and Measurement , 2000 .

[8]  Degang Chen,et al.  Testing of Precision DACs Using Low-Resolution ADCs with Dithering , 2006, 2006 IEEE International Test Conference.