Measurement of single event effects in the 87C51 microcontroller

This report presents the results of Single Event Effect (SEE) cham%htion testing of the Intel 87C5 1FC microcontroller for use in Space Station Freedom (SSF). The 87C51FC exhibited4 types of SEE: RAM upset and three types of system errors, i.e., reset, latchup, and power cycle (a condition not correctable by the onboard watchdog timer). ~emicrocontrollercrosssectionsandresponseratesfor these single event effects were determined.

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