Demonstration of improved transient response of inverters with steep slope strained Si NW TFETs by reduction of TAT with pulsed I-V and NW scaling
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S. Trellenkamp | L. Selmi | K. Bourdelle | S. Mantl | L. Knoll | A. Nichau | S. Richter | A. Schafer | G. V. Luong | Q. Zhao | Q. Zhao
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