CMOS Metrics and Model Evaluation

It is often necessary to make a direct comparison among CMOS technologies offered by different foundries at a particular technology node, among different technology nodes, or between similar technologies on different substrates, such as bulk silicon and SOI. Such comparisons are used in guiding technology development, in benchmarking and selecting the most suitable CMOS manufacturing process or foundry for a given product, and in projecting CMOS product specifications in advance of full-scale design. Quantifiable and measurable metrics for key performance tracking parameters are defined at the device and circuit level. For a correct assessment, the integrity of compact models and EDA used tools for chip design needs to be validated over the full design window. The final verdict on the relative merits of different technologies, based on models or hardware data, can only be obtained with limited certainty.

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