论文信息 - Inspection of defect-induced mode coupling in hollow-core photonic bandgap fibers using time-of-flight

Inspection of defect-induced mode coupling in hollow-core photonic bandgap fibers using time-of-flight

We analyze defect-induced mode coupling in a hollow-core photonic bandgap fiber using time-of-flight, and show its utility in complementing optical time-domain reflectometry.

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