Machine Learning Techniques in Analog Layout Automation

The quality of layouts generated by automated analog design have traditionally not been able to match those from human designers over a wide range of analog designs. The ALIGN (Analog Layout, Intelligently Generated from Netlists) project [2, 3, 6] aims to build an open-source analog layout engine [1] that overcomes these challenges, using a variety of approaches. An important part of the toolbox is the use of machine learning (ML) methods, combined with traditional methods, and this talk overviews our efforts. The input to ALIGN is a SPICE-like netlist and a set of perfor- mance specifications, and the output is a GDSII layout. ALIGN automatically recognizes hierarchies in the input netlist. To detect variations of known blocks in the netlist, approximate subgraph iso- morphism methods based on graph convolutional networks can be used [5]. Repeated structures in a netlist are typically constrained by layout requirements related to symmetry or matching. In [7], we use a mix of graph methods and ML to detect symmetric and array structures, including the use of neural network based approximate matching through the use of the notion of graph edit distances. Once the circuit is annotated, ALIGN generates the layout, going from the lowest level cells to higher levels of the netlist hierarchy. Based on an abstraction of the process design rules, ALIGN builds parameterized cell layouts for each structure, accounting for the need for common centroid layouts where necessary [11]. These cells then undergo placement and routing that honors the geomet- ric constraints (symmetry, common-centroid). The chief parameter that changes during layout is the set of interconnect RC parasitics: excessively large RCs could result in an inability to meet perfor- mance. These values can be controlled by reducing the distance between blocks, or, in the case of R, by using larger effective wire widths (using multiple parallel connections in FinFET technologies where wire widths are quantized) to reduce the effective resistance. ALIGN has developed several approaches based on ML for this purpose [4, 8, 9] that rapidly predict whether a layout will meet the performance constraints that are imposed at the circuit level, and these can be deployed together with conventional algorithmic methods [10] to rapidly prune out infeasible layouts. This presentation overviews our experience in the use of ML- based methods in conjunction with conventional algorithmic ap- proaches for analog design. We will show (a) results from our efforts so far, (b) appropriate methods for mixing ML methods with tra- ditional algorithmic techniques for solving the larger problem of analog layout, (c) limitations of ML methods, and (d) techniques for overcoming these limitations to deliver workable solutions for analog layout automation.