Low-Temperature Positive Secondary Ion Mass Spectrometry of Neat and Argon-Diluted Organic Solids

Secondary ion mass spectrometry of neat solid propane, n-pentane, benzene, toluene, and of propane imbedded in an argon matrix were observed at temperatures varying from 10 to 110 K and show fragmentation patterns similar to those known from ordinary electron impact mass spectrometry. The effects of the nature and energy of the primary probe ion and of the sample temperature were investigated. The analytical potential of the method, e.g., for reactive species trapped in inert matrices, is noted.

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