Perspective on improving the quality of surface and material data analysis in the scientific literature with a focus on x-ray photoelectron spectroscopy (XPS)
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J. E. Stovall | M. Linford | R. Opila | J. Čechal | Seong H. Kim | A. Herrera‐Gomez | H. Cohen | J. Strunk | D. Baer | N. Shirahata | S. Weber | J. Terry | C. Powell | T. Šikola | D. Austin | E. Smith | George H. Major | A. Teplyakov | J. Counsell | M. Rocca | S. Castle | A. Roberts | S. Průša | Jeff Terry | David J. Morgan | Joshua W. Pinder | B. M. Clark | Pavitra Govindan | Regina C. So