Study on the interconnection failure in lead-free soldered assemblies

[1]  Chao-Kun Hu,et al.  Copper interconnections and reliability , 1998 .

[2]  Chunqing Wang,et al.  Intermetallic compounds formation at interface between PBGA solder ball and Au/Ni/Cu/BT PCB substrate after laser reflow processes , 2002 .

[3]  Hyuck-Mo Lee,et al.  Interfacial reaction between Sn-1Bi-5In-9Zn solder and Cu substrate , 1999 .

[4]  Warren C. Oliver,et al.  Indentation power-law creep of high-purity indium , 1999 .

[5]  Fu Guo,et al.  Creep behavior in Cu and Ag particle-reinforced composite and eutectic Sn-3.5Ag and Sn-4.0Ag-0.5Cu non-composite solder joints , 2001 .

[6]  King-Ning Tu,et al.  Electromigration in Sn-Pb solder strips as a function of alloy composition , 2000 .

[7]  M. R. Harrison,et al.  Lead‐free reflow soldering for electronics assembly , 2001 .

[8]  Y. Chan,et al.  An Investigation of Intermetallics Formation Between Pd/Ag Metallization and Sn/Pb/Ag Solder , 2002 .

[9]  Hideo Mori,et al.  Solder joint reliability evaluation of chip scale package using a modified Coffin-Manson equation , 2004, Microelectron. Reliab..

[10]  H.L.J. Pang,et al.  Modeling and simulation of printed circuit board drop test , 2003, Proceedings of the 5th Electronics Packaging Technology Conference (EPTC 2003).

[11]  D.Y.R. Chong,et al.  Drop test reliability assessment of leaded & lead-free solder joints for IC packages , 2004, Proceedings of 6th Electronics Packaging Technology Conference (EPTC 2004) (IEEE Cat. No.04EX971).

[12]  J. Villain,et al.  Creep behaviour of lead free and lead containing solder materials at high homologous temperatures with regard to small solder volumes , 2002 .

[13]  R. A. Fournelle,et al.  Theory for intermetallic phase growth between cu and liquid Sn-Pb solder based on grain boundary diffusion control , 1998 .

[14]  Paul S. Ho,et al.  Electromigration enhanced intermetallic growth and void formation in Pb-free solder joints , 2006 .

[15]  M. Korhonen,et al.  High Sn solder reaction with Cu metallization , 1996 .

[16]  Wei Zhou,et al.  A New Creep Constitutive Model for Eutectic Solder Alloy , 2002 .

[17]  S. Brandenburg Electromigration Studies of Flip Chip Bump Solder Joints , 1998 .

[18]  Y. C. Chan,et al.  GROWTH KINETICS OF INTERMETALLIC COMPOUNDS IN CHIP SCALE PACKAGE SOLDER JOINT , 2001 .

[19]  B. Bhushan,et al.  A Review of Nanoindentation Continuous Stiffness Measurement Technique and Its Applications , 2002 .

[20]  M. Abtew,et al.  Lead-free Solders in Microelectronics , 2000 .

[21]  Masazumi Amagai,et al.  Mechanical characterization of Sn-Ag-based lead-free solders , 2002, Microelectron. Reliab..

[22]  Nikhilesh Chawla,et al.  Measurement and prediction of Young’s modulus of a Pb-free solder , 2004 .

[23]  K. Tu Recent advances on electromigration in very-large-scale-integration of interconnects , 2003 .

[24]  Masazumi Amagai,et al.  High solder joint reliability with lead free solders , 2003, 53rd Electronic Components and Technology Conference, 2003. Proceedings..

[25]  Katsuaki Suganuma,et al.  Effects of intermetallic compounds on properties of Sn–Ag–Cu lead-free soldered joints , 2003 .

[26]  John H. L. Pang,et al.  Thermal cycling aging effects on Sn–Ag–Cu solder joint microstructure, IMC and strength , 2004 .

[27]  Z. Zhong,et al.  Board level drop test and simulation of TFBGA packages for telecommunication applications , 2003, 53rd Electronic Components and Technology Conference, 2003. Proceedings..

[28]  J. Duh,et al.  Characterizing metallurgical reaction of Sn3.0Ag0.5Cu composite solder by mechanical alloying with electroless Ni-P/Cu under-bump metallization after various reflow cycles , 2006 .

[29]  P. S. Ho,et al.  Diffusion Phenomena in Thin Films and Microelectronic Materials , 1989 .

[30]  T. Sritharan,et al.  Effects of solid-state annealing on the interfacial intermetallics between tin-lead solders and copper , 2003 .

[31]  C. Basaran,et al.  Deformation of solder joint under current stressing and numerical simulation--II , 2004 .

[32]  K. Tu,et al.  Six cases of reliability study of Pb-free solder joints in electronic packaging technology , 2002 .

[33]  Sinn-wen Chen,et al.  Phase equilibria and solidification properties of Sn-Cu-Ni alloys , 2002 .

[34]  Dongji Xie,et al.  Solder joint behavior of area array packages in board level drop for handheld devices , 2003, 53rd Electronic Components and Technology Conference, 2003. Proceedings..

[35]  J. H. Lau,et al.  TMA, DMA, DSC, and TGA of lead free solders , 1998, 1998 Proceedings. 48th Electronic Components and Technology Conference (Cat. No.98CH36206).

[36]  T.H. Low,et al.  Isothermal and thermal cycling aging on IMC growth rate in lead-free and lead-based solder interface , 2005, IEEE Transactions on Components and Packaging Technologies.

[37]  K. Tu,et al.  Numerical simulation of current crowding phenomena and their effects on electromigration in very large scale integration interconnects , 2000 .

[38]  Jenq-Gong Duh,et al.  Interfacial morphology and concentration profile in the unleaded solder/Cu joint assembly , 1999 .

[39]  Tao-Chih Chang,et al.  Crystal growth of the intermetallic compounds at the Sn-9Zn- xAg/Cu interface during isothermal aging , 2003 .

[40]  Xiang Dai,et al.  Reliability issues for flip-chip packages , 2004, Microelectron. Reliab..

[41]  Jie Gu,et al.  Simulation of mechanical response of solder joints under drop impact using equivalent layer models , 2005, Proceedings Electronic Components and Technology, 2005. ECTC '05..

[42]  Richard P. Vinci,et al.  Nanoindentation measurements on Cu–Sn and Ag–Sn intermetallics formed in Pb-free solder joints , 2003 .

[43]  Chwee Teck Lim,et al.  Drop impact survey of portable electronic products , 2003, 53rd Electronic Components and Technology Conference, 2003. Proceedings..

[44]  Z. P. Wang,et al.  Microstructure and intermetallic growth effects on shear and fatigue strength of solder joints subjected to thermal cycling aging , 2001 .

[45]  Thirumany Sritharan,et al.  Interface reaction between copper and molten tin–lead solders , 2001 .

[46]  G. Lucey,et al.  The growth of Cu-Sn intermetallics at a pretinned copper-solder interface , 1992 .

[47]  Sinn-wen Chen,et al.  Mechanical properties and intermetallic compound formation at the Sn/Ni and Sn-0.7wt.%Cu/Ni joints , 2003 .

[48]  Y. G. Lee,et al.  Phase Analysis in the Solder Joint of Sn-Cu Solder/IMCs/Cu Substrate , 1999 .

[49]  Liping Zhu,et al.  Modeling technique for reliability assessment of portable electronic product subjected to drop impact loads , 2003, 53rd Electronic Components and Technology Conference, 2003. Proceedings..

[50]  Jae-Woong Nah,et al.  Electromigration in Pb-free flip chip solder joints on flexible substrates , 2006 .

[51]  E. Davitt,et al.  Effects of thermomechanical cycling on lead and lead-free (SnPb and SnAgCu) surface mount solder joints , 2001, Microelectron. Reliab..

[52]  K. Tu,et al.  Direct correlation between mechanical failure and metallurgical reaction in flip chip solder joints , 1999 .

[53]  Nikhilesh Chawla,et al.  Deformation behavior of (Cu, Ag)–Sn intermetallics by nanoindentation , 2004 .

[54]  Y. L. Lin,et al.  Effect of Cu concentration on the reactions between Sn-Ag-Cu solders and Ni , 2002 .

[55]  R. Vinci,et al.  Measuring the mechanical properties of Pb-free solder and Sn-based intermetallics by nanoindentation , 2003 .

[56]  Frank Stepniak Failure criteria of flip chip joints during accelerated testing , 2002, Microelectron. Reliab..

[57]  Cheol-Woong Yang,et al.  Intermetallic compound layer growth at the interface between Sn-Cu-Ni solder and Cu substrate , 2004 .

[58]  Paul Harris,et al.  The role of intermetallic compounds in lead‐free soldering , 1998 .

[59]  K. N. Subramanian,et al.  Micromechanical characterization of thermomechanically fatigued lead-free solder joints , 2002 .

[60]  Seung-Boo Jung,et al.  Growth kinetics of Ni3Sn4 and Ni3P layer between Sn–3.5Ag solder and electroless Ni–P substrate , 2004 .

[61]  J. Pang,et al.  in-situ electromigration study on Sn−Ag−Cu solder joint by digital image speckle analysis , 2004, Proceedings of 6th Electronics Packaging Technology Conference (EPTC 2004) (IEEE Cat. No.04EX971).

[62]  Sinn-wen Chen,et al.  Electromigration effect upon the Sn/Ag and Sn/Ni interfacial reactions at various temperatures , 2002 .

[63]  F. Che,et al.  Intermetallic Growth and Failure Study for Sn-Ag-Cu/ENIG PBGA Solder Joints Subject to Thermal Cycling , 2005, Proceedings Electronic Components and Technology, 2005. ECTC '05..

[64]  Zhong Chen,et al.  Interfacial reaction between Sn-rich solders and Ni-based metallization , 2004 .

[65]  W. Meeker Accelerated Testing: Statistical Models, Test Plans, and Data Analyses , 1991 .

[66]  K. Suganuma Advances in lead-free electronics soldering , 2001 .

[67]  K. Tu Cu/Sn interfacial reactions: thin-film case versus bulk case , 1996 .

[68]  Leon M Keer,et al.  Constitutive and damage model for a lead-free solder , 2001 .

[69]  Zhong Chen,et al.  Solid state interfacial reaction of Sn–37Pb and Sn–3.5Ag solders with Ni–P under bump metallization , 2004 .

[70]  E. Bradley Lead-free solder assembly: impact and opportunity , 2003, 53rd Electronic Components and Technology Conference, 2003. Proceedings..

[71]  K. Tu,et al.  Effect of electromigration-induced back stress gradient on nanoindentation marker movement in SnAgCu solder joints , 2006 .

[72]  King-Ning Tu,et al.  Effect of current crowding on vacancy diffusion and void formation in electromigration , 2000 .

[73]  C. Kao,et al.  Reactions between Sn-Ag-Cu lead-free solders and the Au/Ni surface finish in advanced electronic packages , 2002 .

[74]  Y. Miyashita,et al.  Low-cycle fatigue behavior of Sn-Ag, Sn-Ag-Cu, and Sn-Ag-Cu-Bi lead-free solders , 2002 .

[75]  J. Pang,et al.  Nanoindentation on SnAgCu lead-free solder joints and analysis , 2006 .

[76]  D. R. Frear,et al.  Electromigration of eutectic SnPb and SnAg3.8Cu0.7 flip chip solder bumps and under-bump metallization , 2001 .

[77]  W. Ren,et al.  Thermo-mechanical creep of two solder alloys , 1998, 1998 Proceedings. 48th Electronic Components and Technology Conference (Cat. No.98CH36206).

[78]  Angela Grusd,et al.  Lead‐free alloys , 1998 .

[79]  J. Pang,et al.  Interfacial IMC and Kirkendall void on SAC solder joints subject to thermal cycling , 2005, 2005 7th Electronic Packaging Technology Conference.

[80]  D. R. Frear,et al.  Morphology, kinetics, and thermodynamics of solid-state aging of eutectic SnPb and Pb-free solders (Sn–3.5Ag, Sn–3.8Ag–0.7Cu and Sn–0.7Cu) on Cu , 2002 .

[81]  Guna S Selvaduray,et al.  Solder joint fatigue models: review and applicability to chip scale packages , 2000 .

[82]  Frank Richter,et al.  Investigation of creep behaviour under load during indentation experiments and its influence on hardness and modulus results , 2001 .

[83]  P. Vianco,et al.  Acceleration models, constitutive equations, and reliability of lead-free solders and joints , 2003, 53rd Electronic Components and Technology Conference, 2003. Proceedings..

[84]  D. Frear,et al.  Damage mechanics of microelectronics solder joints under high current densities , 2003, 2004 Proceedings. 54th Electronic Components and Technology Conference (IEEE Cat. No.04CH37546).

[85]  S. Dirnfeld,et al.  Microstructure investigation of copper-tin intermetallics and the influence of layer thickness on shear strength : low-tin solders are recommended in applications where high temperatures encourage intermetallic buildup , 1990 .

[86]  Y. C. Chan,et al.  Growth kinetic studies of Cu–Sn intermetallic compound and its effect on shear strength of LCCC SMT solder joints , 1998 .

[87]  J. W. Morris,et al.  Analysis of low-temperature intermetallic growth in copper-tin diffusion couples , 1992 .

[88]  L. Crane,et al.  Lead-free chip scale packages: assembly and drop test reliability , 2006, IEEE Transactions on Electronics Packaging Manufacturing.

[89]  Fu Guo,et al.  Effects of reflow on wettability, microstructure and mechanical properties in lead-free solders , 2000 .

[90]  Soon-Bok Lee,et al.  A mechanistic model for fatigue life prediction of solder joints for electronic packages , 1997 .

[91]  J. W. Morris,et al.  The effect of Cu6Sn5 whisker precipitates in bulk 60sn-40pb solder , 1987 .

[92]  Kim,et al.  Kinetic analysis of the soldering reaction between eutectic SnPb alloy and Cu accompanied by ripening. , 1996, Physical review. B, Condensed matter.

[93]  Kinuko Mishiro,et al.  Effect of the drop impact on BGA/CSP package reliability , 2002, Microelectron. Reliab..

[94]  D.Y.R. Chong,et al.  Drop reliability performance assessment for PCB assemblies of chip scale packages (CSP) , 2005, 2005 7th Electronic Packaging Technology Conference.

[95]  Ee Hua Wong,et al.  Board Level Drop Impact—Fundamental and Parametric Analysis , 2005 .

[96]  Hyuck-Mo Lee,et al.  Interfacial Microstructure and Joint Strength of Sn–3.5Ag–X (X = Cu, In, Ni) Solder Joint , 2002 .

[97]  K. Tu,et al.  Electromigration effect on intermetallic growth and Young’s modulus in SAC solder joint , 2006 .

[98]  J. Pang,et al.  Nano-indentation characterization of Ni–Cu–Sn IMC layer subject to isothermal aging , 2006 .

[99]  Yi-Shao Lai,et al.  Experimental studies of board-level reliability of chip-scale packages subjected to JEDEC drop test condition , 2006, Microelectron. Reliab..

[100]  Zhaowei Zhong,et al.  Impact life prediction modeling of TFBGA packages under board level drop test , 2004, Microelectron. Reliab..

[101]  V. I. Igoshev,et al.  Creep phenomena in lead-free solders , 2000 .

[102]  J. Pang,et al.  Bulk solder and solder joint properties for lead free 95.5Sn-3.8Ag-0.7Cu solder alloy , 2003, 53rd Electronic Components and Technology Conference, 2003. Proceedings..

[103]  B. Xiong Mechanics of materials characterization of lead-free solders. , 2005 .

[104]  R. F. Keltie,et al.  Guidelines for the Use of Approximations in Shock Response Analysis of Electronic Assemblies , 1993 .

[105]  M. Fine,et al.  Thickening kinetics of interfacial Cu6Sn5 and Cu3Sn layers during reaction of liquid tin with solid copper , 2003 .

[106]  E. Suhir Is the maximum acceleration an adequate criterion of the dynamic strength of a structural element in an electronic product , 1997 .

[107]  S. L. Ngoh,et al.  Intermetallic growth studies on Sn-Ag-Cu lead-free solder joints , 2004 .

[108]  Paul T. Vianco,et al.  Intermetallic compound layer development during the solid state thermal aging of 63Sn-37Pb solder/Au-Pt-Pd thick film couples , 1997 .

[109]  W. Kempe,et al.  Degradation of Sn‐Ag‐Cu heat‐sink attachment during thermal shock cycling , 2005 .

[110]  John H. L. Pang,et al.  Electromigration induced ductile-to-brittle transition in lead-free solder joints , 2006 .

[111]  Subra Suresh,et al.  Computational modeling of the forward and reverse problems in instrumented sharp indentation , 2001 .

[112]  Sung K. Kang,et al.  The Microstructure, Thermal Fatigue, and Failure Analysis of Near-Ternary Eutectic Sn-Ag-Cu Solder Joints , 2004 .

[113]  K. Tu,et al.  Tin–lead (SnPb) solder reaction in flip chip technology , 2001 .

[114]  Ephraim Suhir Could Shock Tests Adequately Mimic Drop Test Conditions , 2002 .

[115]  Xin Ma,et al.  Development of Cu-Sn intermetallic compound at Pb-free solder/Cu joint interface , 2003 .

[116]  Fu Guo,et al.  Mechanical properties of intermetallic compounds associated with Pb-free solder joints using nanoindentation , 2003 .

[117]  J. Huang A study of failure of SMT solder joints under thermal cycles by statistics , 1992 .

[118]  Nikhilesh Chawla,et al.  Young's modulus of (Cu, Ag)-Sn intermetallics measured by nanoindentation , 2004 .

[119]  Interfacial reactions, microstructure and mechanical properties of Pb-free solder joints in PBGA laminates , 2002, 52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345).

[120]  B. Pešić Electromigration & electronic device degradation: Editor: Aris Christou. Publisher: John Wiley & Sons Ltd, Baffins Lane, Chichester, West Sussex PO19 1UD, England. Price: 85 GBP (ISBN: 0-471-58489-4). Published in 1994 , 1997 .

[121]  M. Tammaro,et al.  Investigation of the temperature dependence in Black’s equation using microscopic electromigration modeling , 1999 .

[122]  Masazumi Amagai,et al.  A mechanical reliability assessment of solder joints , 2001, Advances in Electronic Materials and Packaging 2001 (Cat. No.01EX506).