Study on the interconnection failure in lead-free soldered assemblies
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[1] Chao-Kun Hu,et al. Copper interconnections and reliability , 1998 .
[2] Chunqing Wang,et al. Intermetallic compounds formation at interface between PBGA solder ball and Au/Ni/Cu/BT PCB substrate after laser reflow processes , 2002 .
[3] Hyuck-Mo Lee,et al. Interfacial reaction between Sn-1Bi-5In-9Zn solder and Cu substrate , 1999 .
[4] Warren C. Oliver,et al. Indentation power-law creep of high-purity indium , 1999 .
[5] Fu Guo,et al. Creep behavior in Cu and Ag particle-reinforced composite and eutectic Sn-3.5Ag and Sn-4.0Ag-0.5Cu non-composite solder joints , 2001 .
[6] King-Ning Tu,et al. Electromigration in Sn-Pb solder strips as a function of alloy composition , 2000 .
[7] M. R. Harrison,et al. Lead‐free reflow soldering for electronics assembly , 2001 .
[8] Y. Chan,et al. An Investigation of Intermetallics Formation Between Pd/Ag Metallization and Sn/Pb/Ag Solder , 2002 .
[9] Hideo Mori,et al. Solder joint reliability evaluation of chip scale package using a modified Coffin-Manson equation , 2004, Microelectron. Reliab..
[10] H.L.J. Pang,et al. Modeling and simulation of printed circuit board drop test , 2003, Proceedings of the 5th Electronics Packaging Technology Conference (EPTC 2003).
[11] D.Y.R. Chong,et al. Drop test reliability assessment of leaded & lead-free solder joints for IC packages , 2004, Proceedings of 6th Electronics Packaging Technology Conference (EPTC 2004) (IEEE Cat. No.04EX971).
[12] J. Villain,et al. Creep behaviour of lead free and lead containing solder materials at high homologous temperatures with regard to small solder volumes , 2002 .
[13] R. A. Fournelle,et al. Theory for intermetallic phase growth between cu and liquid Sn-Pb solder based on grain boundary diffusion control , 1998 .
[14] Paul S. Ho,et al. Electromigration enhanced intermetallic growth and void formation in Pb-free solder joints , 2006 .
[15] M. Korhonen,et al. High Sn solder reaction with Cu metallization , 1996 .
[16] Wei Zhou,et al. A New Creep Constitutive Model for Eutectic Solder Alloy , 2002 .
[17] S. Brandenburg. Electromigration Studies of Flip Chip Bump Solder Joints , 1998 .
[18] Y. C. Chan,et al. GROWTH KINETICS OF INTERMETALLIC COMPOUNDS IN CHIP SCALE PACKAGE SOLDER JOINT , 2001 .
[19] B. Bhushan,et al. A Review of Nanoindentation Continuous Stiffness Measurement Technique and Its Applications , 2002 .
[20] M. Abtew,et al. Lead-free Solders in Microelectronics , 2000 .
[21] Masazumi Amagai,et al. Mechanical characterization of Sn-Ag-based lead-free solders , 2002, Microelectron. Reliab..
[22] Nikhilesh Chawla,et al. Measurement and prediction of Young’s modulus of a Pb-free solder , 2004 .
[23] K. Tu. Recent advances on electromigration in very-large-scale-integration of interconnects , 2003 .
[24] Masazumi Amagai,et al. High solder joint reliability with lead free solders , 2003, 53rd Electronic Components and Technology Conference, 2003. Proceedings..
[25] Katsuaki Suganuma,et al. Effects of intermetallic compounds on properties of Sn–Ag–Cu lead-free soldered joints , 2003 .
[26] John H. L. Pang,et al. Thermal cycling aging effects on Sn–Ag–Cu solder joint microstructure, IMC and strength , 2004 .
[27] Z. Zhong,et al. Board level drop test and simulation of TFBGA packages for telecommunication applications , 2003, 53rd Electronic Components and Technology Conference, 2003. Proceedings..
[28] J. Duh,et al. Characterizing metallurgical reaction of Sn3.0Ag0.5Cu composite solder by mechanical alloying with electroless Ni-P/Cu under-bump metallization after various reflow cycles , 2006 .
[29] P. S. Ho,et al. Diffusion Phenomena in Thin Films and Microelectronic Materials , 1989 .
[30] T. Sritharan,et al. Effects of solid-state annealing on the interfacial intermetallics between tin-lead solders and copper , 2003 .
[31] C. Basaran,et al. Deformation of solder joint under current stressing and numerical simulation--II , 2004 .
[32] K. Tu,et al. Six cases of reliability study of Pb-free solder joints in electronic packaging technology , 2002 .
[33] Sinn-wen Chen,et al. Phase equilibria and solidification properties of Sn-Cu-Ni alloys , 2002 .
[34] Dongji Xie,et al. Solder joint behavior of area array packages in board level drop for handheld devices , 2003, 53rd Electronic Components and Technology Conference, 2003. Proceedings..
[35] J. H. Lau,et al. TMA, DMA, DSC, and TGA of lead free solders , 1998, 1998 Proceedings. 48th Electronic Components and Technology Conference (Cat. No.98CH36206).
[36] T.H. Low,et al. Isothermal and thermal cycling aging on IMC growth rate in lead-free and lead-based solder interface , 2005, IEEE Transactions on Components and Packaging Technologies.
[37] K. Tu,et al. Numerical simulation of current crowding phenomena and their effects on electromigration in very large scale integration interconnects , 2000 .
[38] Jenq-Gong Duh,et al. Interfacial morphology and concentration profile in the unleaded solder/Cu joint assembly , 1999 .
[39] Tao-Chih Chang,et al. Crystal growth of the intermetallic compounds at the Sn-9Zn- xAg/Cu interface during isothermal aging , 2003 .
[40] Xiang Dai,et al. Reliability issues for flip-chip packages , 2004, Microelectron. Reliab..
[41] Jie Gu,et al. Simulation of mechanical response of solder joints under drop impact using equivalent layer models , 2005, Proceedings Electronic Components and Technology, 2005. ECTC '05..
[42] Richard P. Vinci,et al. Nanoindentation measurements on Cu–Sn and Ag–Sn intermetallics formed in Pb-free solder joints , 2003 .
[43] Chwee Teck Lim,et al. Drop impact survey of portable electronic products , 2003, 53rd Electronic Components and Technology Conference, 2003. Proceedings..
[44] Z. P. Wang,et al. Microstructure and intermetallic growth effects on shear and fatigue strength of solder joints subjected to thermal cycling aging , 2001 .
[45] Thirumany Sritharan,et al. Interface reaction between copper and molten tin–lead solders , 2001 .
[46] G. Lucey,et al. The growth of Cu-Sn intermetallics at a pretinned copper-solder interface , 1992 .
[47] Sinn-wen Chen,et al. Mechanical properties and intermetallic compound formation at the Sn/Ni and Sn-0.7wt.%Cu/Ni joints , 2003 .
[48] Y. G. Lee,et al. Phase Analysis in the Solder Joint of Sn-Cu Solder/IMCs/Cu Substrate , 1999 .
[49] Liping Zhu,et al. Modeling technique for reliability assessment of portable electronic product subjected to drop impact loads , 2003, 53rd Electronic Components and Technology Conference, 2003. Proceedings..
[50] Jae-Woong Nah,et al. Electromigration in Pb-free flip chip solder joints on flexible substrates , 2006 .
[51] E. Davitt,et al. Effects of thermomechanical cycling on lead and lead-free (SnPb and SnAgCu) surface mount solder joints , 2001, Microelectron. Reliab..
[52] K. Tu,et al. Direct correlation between mechanical failure and metallurgical reaction in flip chip solder joints , 1999 .
[53] Nikhilesh Chawla,et al. Deformation behavior of (Cu, Ag)–Sn intermetallics by nanoindentation , 2004 .
[54] Y. L. Lin,et al. Effect of Cu concentration on the reactions between Sn-Ag-Cu solders and Ni , 2002 .
[55] R. Vinci,et al. Measuring the mechanical properties of Pb-free solder and Sn-based intermetallics by nanoindentation , 2003 .
[56] Frank Stepniak. Failure criteria of flip chip joints during accelerated testing , 2002, Microelectron. Reliab..
[57] Cheol-Woong Yang,et al. Intermetallic compound layer growth at the interface between Sn-Cu-Ni solder and Cu substrate , 2004 .
[58] Paul Harris,et al. The role of intermetallic compounds in lead‐free soldering , 1998 .
[59] K. N. Subramanian,et al. Micromechanical characterization of thermomechanically fatigued lead-free solder joints , 2002 .
[60] Seung-Boo Jung,et al. Growth kinetics of Ni3Sn4 and Ni3P layer between Sn–3.5Ag solder and electroless Ni–P substrate , 2004 .
[61] J. Pang,et al. in-situ electromigration study on Sn−Ag−Cu solder joint by digital image speckle analysis , 2004, Proceedings of 6th Electronics Packaging Technology Conference (EPTC 2004) (IEEE Cat. No.04EX971).
[62] Sinn-wen Chen,et al. Electromigration effect upon the Sn/Ag and Sn/Ni interfacial reactions at various temperatures , 2002 .
[63] F. Che,et al. Intermetallic Growth and Failure Study for Sn-Ag-Cu/ENIG PBGA Solder Joints Subject to Thermal Cycling , 2005, Proceedings Electronic Components and Technology, 2005. ECTC '05..
[64] Zhong Chen,et al. Interfacial reaction between Sn-rich solders and Ni-based metallization , 2004 .
[65] W. Meeker. Accelerated Testing: Statistical Models, Test Plans, and Data Analyses , 1991 .
[66] K. Suganuma. Advances in lead-free electronics soldering , 2001 .
[67] K. Tu. Cu/Sn interfacial reactions: thin-film case versus bulk case , 1996 .
[68] Leon M Keer,et al. Constitutive and damage model for a lead-free solder , 2001 .
[69] Zhong Chen,et al. Solid state interfacial reaction of Sn–37Pb and Sn–3.5Ag solders with Ni–P under bump metallization , 2004 .
[70] E. Bradley. Lead-free solder assembly: impact and opportunity , 2003, 53rd Electronic Components and Technology Conference, 2003. Proceedings..
[71] K. Tu,et al. Effect of electromigration-induced back stress gradient on nanoindentation marker movement in SnAgCu solder joints , 2006 .
[72] King-Ning Tu,et al. Effect of current crowding on vacancy diffusion and void formation in electromigration , 2000 .
[73] C. Kao,et al. Reactions between Sn-Ag-Cu lead-free solders and the Au/Ni surface finish in advanced electronic packages , 2002 .
[74] Y. Miyashita,et al. Low-cycle fatigue behavior of Sn-Ag, Sn-Ag-Cu, and Sn-Ag-Cu-Bi lead-free solders , 2002 .
[75] J. Pang,et al. Nanoindentation on SnAgCu lead-free solder joints and analysis , 2006 .
[76] D. R. Frear,et al. Electromigration of eutectic SnPb and SnAg3.8Cu0.7 flip chip solder bumps and under-bump metallization , 2001 .
[77] W. Ren,et al. Thermo-mechanical creep of two solder alloys , 1998, 1998 Proceedings. 48th Electronic Components and Technology Conference (Cat. No.98CH36206).
[78] Angela Grusd,et al. Lead‐free alloys , 1998 .
[79] J. Pang,et al. Interfacial IMC and Kirkendall void on SAC solder joints subject to thermal cycling , 2005, 2005 7th Electronic Packaging Technology Conference.
[80] D. R. Frear,et al. Morphology, kinetics, and thermodynamics of solid-state aging of eutectic SnPb and Pb-free solders (Sn–3.5Ag, Sn–3.8Ag–0.7Cu and Sn–0.7Cu) on Cu , 2002 .
[81] Guna S Selvaduray,et al. Solder joint fatigue models: review and applicability to chip scale packages , 2000 .
[82] Frank Richter,et al. Investigation of creep behaviour under load during indentation experiments and its influence on hardness and modulus results , 2001 .
[83] P. Vianco,et al. Acceleration models, constitutive equations, and reliability of lead-free solders and joints , 2003, 53rd Electronic Components and Technology Conference, 2003. Proceedings..
[84] D. Frear,et al. Damage mechanics of microelectronics solder joints under high current densities , 2003, 2004 Proceedings. 54th Electronic Components and Technology Conference (IEEE Cat. No.04CH37546).
[85] S. Dirnfeld,et al. Microstructure investigation of copper-tin intermetallics and the influence of layer thickness on shear strength : low-tin solders are recommended in applications where high temperatures encourage intermetallic buildup , 1990 .
[86] Y. C. Chan,et al. Growth kinetic studies of Cu–Sn intermetallic compound and its effect on shear strength of LCCC SMT solder joints , 1998 .
[87] J. W. Morris,et al. Analysis of low-temperature intermetallic growth in copper-tin diffusion couples , 1992 .
[88] L. Crane,et al. Lead-free chip scale packages: assembly and drop test reliability , 2006, IEEE Transactions on Electronics Packaging Manufacturing.
[89] Fu Guo,et al. Effects of reflow on wettability, microstructure and mechanical properties in lead-free solders , 2000 .
[90] Soon-Bok Lee,et al. A mechanistic model for fatigue life prediction of solder joints for electronic packages , 1997 .
[91] J. W. Morris,et al. The effect of Cu6Sn5 whisker precipitates in bulk 60sn-40pb solder , 1987 .
[92] Kim,et al. Kinetic analysis of the soldering reaction between eutectic SnPb alloy and Cu accompanied by ripening. , 1996, Physical review. B, Condensed matter.
[93] Kinuko Mishiro,et al. Effect of the drop impact on BGA/CSP package reliability , 2002, Microelectron. Reliab..
[94] D.Y.R. Chong,et al. Drop reliability performance assessment for PCB assemblies of chip scale packages (CSP) , 2005, 2005 7th Electronic Packaging Technology Conference.
[95] Ee Hua Wong,et al. Board Level Drop Impact—Fundamental and Parametric Analysis , 2005 .
[96] Hyuck-Mo Lee,et al. Interfacial Microstructure and Joint Strength of Sn–3.5Ag–X (X = Cu, In, Ni) Solder Joint , 2002 .
[97] K. Tu,et al. Electromigration effect on intermetallic growth and Young’s modulus in SAC solder joint , 2006 .
[98] J. Pang,et al. Nano-indentation characterization of Ni–Cu–Sn IMC layer subject to isothermal aging , 2006 .
[99] Yi-Shao Lai,et al. Experimental studies of board-level reliability of chip-scale packages subjected to JEDEC drop test condition , 2006, Microelectron. Reliab..
[100] Zhaowei Zhong,et al. Impact life prediction modeling of TFBGA packages under board level drop test , 2004, Microelectron. Reliab..
[101] V. I. Igoshev,et al. Creep phenomena in lead-free solders , 2000 .
[102] J. Pang,et al. Bulk solder and solder joint properties for lead free 95.5Sn-3.8Ag-0.7Cu solder alloy , 2003, 53rd Electronic Components and Technology Conference, 2003. Proceedings..
[103] B. Xiong. Mechanics of materials characterization of lead-free solders. , 2005 .
[104] R. F. Keltie,et al. Guidelines for the Use of Approximations in Shock Response Analysis of Electronic Assemblies , 1993 .
[105] M. Fine,et al. Thickening kinetics of interfacial Cu6Sn5 and Cu3Sn layers during reaction of liquid tin with solid copper , 2003 .
[106] E. Suhir. Is the maximum acceleration an adequate criterion of the dynamic strength of a structural element in an electronic product , 1997 .
[107] S. L. Ngoh,et al. Intermetallic growth studies on Sn-Ag-Cu lead-free solder joints , 2004 .
[108] Paul T. Vianco,et al. Intermetallic compound layer development during the solid state thermal aging of 63Sn-37Pb solder/Au-Pt-Pd thick film couples , 1997 .
[109] W. Kempe,et al. Degradation of Sn‐Ag‐Cu heat‐sink attachment during thermal shock cycling , 2005 .
[110] John H. L. Pang,et al. Electromigration induced ductile-to-brittle transition in lead-free solder joints , 2006 .
[111] Subra Suresh,et al. Computational modeling of the forward and reverse problems in instrumented sharp indentation , 2001 .
[112] Sung K. Kang,et al. The Microstructure, Thermal Fatigue, and Failure Analysis of Near-Ternary Eutectic Sn-Ag-Cu Solder Joints , 2004 .
[113] K. Tu,et al. Tin–lead (SnPb) solder reaction in flip chip technology , 2001 .
[114] Ephraim Suhir. Could Shock Tests Adequately Mimic Drop Test Conditions , 2002 .
[115] Xin Ma,et al. Development of Cu-Sn intermetallic compound at Pb-free solder/Cu joint interface , 2003 .
[116] Fu Guo,et al. Mechanical properties of intermetallic compounds associated with Pb-free solder joints using nanoindentation , 2003 .
[117] J. Huang. A study of failure of SMT solder joints under thermal cycles by statistics , 1992 .
[118] Nikhilesh Chawla,et al. Young's modulus of (Cu, Ag)-Sn intermetallics measured by nanoindentation , 2004 .
[119] Interfacial reactions, microstructure and mechanical properties of Pb-free solder joints in PBGA laminates , 2002, 52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345).
[120] B. Pešić. Electromigration & electronic device degradation: Editor: Aris Christou. Publisher: John Wiley & Sons Ltd, Baffins Lane, Chichester, West Sussex PO19 1UD, England. Price: 85 GBP (ISBN: 0-471-58489-4). Published in 1994 , 1997 .
[121] M. Tammaro,et al. Investigation of the temperature dependence in Black’s equation using microscopic electromigration modeling , 1999 .
[122] Masazumi Amagai,et al. A mechanical reliability assessment of solder joints , 2001, Advances in Electronic Materials and Packaging 2001 (Cat. No.01EX506).