Difference in the detection limits of flaws in the depths of multi-layered and continuous aluminum plates using low-frequency eddy current testing
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Keiji Tsukada | Toshihiko Kiwa | Hironobu Yamada | T. Kiwa | K. Tsukada | Hironobu Yamada | Teruki Hasegawa | Yudai Ishihara | Y. Ishihara | T. Hasegawa
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