A 360°-tilt specimen holder for electron tomography in an ultrahigh-voltage electron microscope

A 360°-tilt specimen holder was designed for electron tomography in an ultrahigh-voltage electron microscope. The new holder is of simple noneucentric and single-axis tilting type, with a minimum tilt step of 0.01°. It is applicable to different types of specimens with clamping arrangement. Experiments show that images can be observed around the maximum tilt range of ±85°. The direction of the tilt axis is determined from the 0°- and 180°-tilt images. The possibility of correcting image alteration due to different specimen height is also discussed.