Analog checkers with absolute and relative tolerances

The design of checkers aimed at the concurrent test of analog and mixed-signal circuits is considered in this paper. These checkers can on-line test duplicated and fully differential analog circuits. The test approach is based on exploiting the inherent redundancy of these circuits which results in the use of a code for the analog signals. The analog code is monitored by the checkers. An error signal which complies with existing digital self-checking parts is generated in the case that a code fails out of the valid code space. For the verification of the analog codes, absolute tolerance margins and tolerance margins which are made relative to signal amplitude are considered. A test pattern generator for off-line testing of the checkers is proposed. >

[1]  Abhijit Chatterjee.  CONCURRENT ERROR DETECTION IN LINEAR ANALOG AND SWITCHED-CAPACITOR STATE VARIABLE SYSTEMS USING CONT , 1991, 1991, Proceedings. International Test Conference.

[2]  Abhijit Chatterjee,et al.  Checksum-based concurrent error detection in linear analog systems with second and higher order stages , 1992, Digest of Papers. 1992 IEEE VLSI Test Symposium.

[3]  Michael Nicolaidis.  Finitely self-checking circuits and their application on current sensors , 1993, Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium.

[4]  Salvador Mir,et al.  Built-in Self-test And Fault Diagnosis Of Fully Differential Analogue Circuits , 1994, IEEE/ACM International Conference on Computer-Aided Design.

[5]  Abhijit Chatterjee.  Concurrent Error Detection in Linear Analog and Switched-Capacitor State Variable Systems Using Continuous Checksums , 1991 .

[6]  Vladimir Kolarik,et al.  Designing self-exercising analogue checkers , 1994, Proceedings of IEEE VLSI Test Symposium.

[7]  Chin-Long Wey,et al.  TEST GENERATION AND CONCURIPENT ERROR DETECTION IN CURRENT-MODE A/D CONVERTERS , 1992, Proceedings International Test Conference 1992.

[8]  G. Temes,et al.  Analog MOS Integrated Circuits for Signal Processing , 1986 .

[9]  Robert G. Meyer,et al.  Analysis and Design of Analog Integrated Circuits , 1993 .

[10]  Vladimir Kolarik,et al.  Towards Self-Checking Mixed-Signal Integrated Circuits , 1993, ESSCIRC '93: Nineteenth European Solid-State Circuits Conference.

[11]  José Luis Huertas,et al.  On-line testing of switched-capacitor filters , 1992, Digest of Papers. 1992 IEEE VLSI Test Symposium.

[12]  Takashi Matsubara,et al.  A proposal for error-tolerating codes , 1993, FTCS-23 The Twenty-Third International Symposium on Fault-Tolerant Computing.

[13]  B. G. Bosch,et al.  A silicon bipolar 4-bit 1-Gsample/s full Nyquist A/D converter , 1988 .

[14]  J.L. Huertas,et al.  A practical implementation of fault-tolerant switched-capacitor circuits , 1991, 1991., IEEE International Sympoisum on Circuits and Systems.