A tolerance analysis for manufacturing to direct process capability improvement efforts
暂无分享,去创建一个
[1] Christopher M. Durham,et al. High Speed CMOS Design Styles , 1998 .
[2] J. A. Appels,et al. Formation of Silicon Nitride at a Si ‐ SiO2 Interface during Local Oxidation of Silicon and during Heat‐Treatment of Oxidized Silicon in NH 3 Gas , 1976 .
[3] Kailash C. Kapur. Engineering Quality by Design: Interpreting the Taguchi Approach , 1991 .
[4] Neil D. Cox,et al. How to perform statistical tolerance analysis , 1987 .
[5] Keith M. Carrig,et al. Circuit Design Margin and Design Variability , 1999 .
[6] Sidney Addelman,et al. trans-Dimethanolbis(1,1,1-trifluoro-5,5-dimethylhexane-2,4-dionato)zinc(II) , 2008, Acta crystallographica. Section E, Structure reports online.