Polarization dependent interface properties of ferroelectric Schottky barriers studied by soft X-ray absorption spectroscopy
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R. Waser | A. Petraru | H. Kohlstedt | R. Ramesh | A. Scholl | P. Yu | T. Schneller | Y. Wanli | J. Guo | T. Learmonth | K. E. Smith | B. Freelon | P. Glans | M. M. J. Denlinger