A New Degradation Mechanism Induced by DX-Centers in AlGaAs/InGaAs PM-HEMT's
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A. Neviani | G. Meneghesso | A. Paccagnella | L. Vendrame | E. Zanoni | C. Canali | E. De Bortoli | A. Paccagnella | C. Canali | A. Neviani | G. Meneghesso | E. Zanoni | L. Vendrame | E. De Bortoli
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